Zobrazeno 1 - 5
of 5
pro vyhledávání: '"W. S. Seow"'
Publikováno v:
Journal of Applied Physics. 85:994-1001
A mathematical model is presented to explain the effect of ultraviolet (UV) irradiation on the minority carrier recombination lifetime (LT) and surface barrier observed in thermally oxidized, RCA cleaned, and contaminated silicon wafers. The proposed
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::53418023914d918b34330815835ce21a
https://doi.org/10.1063/1.369220
https://doi.org/10.1063/1.369220
Autor:
N. E. Hussey, W. S. Seow, R. A. Doyle, T. Badeche, L. Fermond, Ian R. Fisher, O. Monnereau, C. D. Dewhurst, A.M. Ghorayeb
Publikováno v:
Molecular Crystals and Liquid Crystals Science and Technology. Section A. Molecular Crystals and Liquid Crystals. 311:435-442
In this work we report on the intercalation of single crystals of Bi 2 Sr 2 CaCu 2 O 8 with iodine to form the stage-1 intercalated complex IBi 2 Sr 2 CaCu 2 O 8 , and on the electrical resistivity of this final product, both as a function of tempera
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::603fe3886fe00439aadb250ce0e46ab6
https://doi.org/10.1080/10587259808042422
https://doi.org/10.1080/10587259808042422
Publikováno v:
Physical Review Letters. 77:1155-1158
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f8aad11b469ba76be304dc15e4b89a63
https://doi.org/10.1103/physrevlett.77.1155
https://doi.org/10.1103/physrevlett.77.1155
Publikováno v:
Physical Review Letters. 75:4520-4523
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::58d2af56227c1d8dd3926ffae619697e
https://doi.org/10.1103/physrevlett.75.4520
https://doi.org/10.1103/physrevlett.75.4520
Publikováno v:
Japanese Journal of Applied Physics. 40:18
Crystal-originated particle (COP) side-wall angles and rates of change in width were measured after treatment in an SC-1 solution by atomic force microscopy (AFM) to determine the shape, size and type of the particles on a polished (100) Si wafer sur
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d5c7a62539a9430447b179ed1c2a97c5
https://doi.org/10.1143/jjap.40.18
https://doi.org/10.1143/jjap.40.18