Zobrazeno 1 - 10
of 47
pro vyhledávání: '"W. O. Saxton"'
Autor:
W O Saxton
Publikováno v:
Electron Microscopy and Analysis 1997 ISBN: 9781003063056
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d47dd06ef57dbdf8035614db212b9083
https://doi.org/10.1201/9781003063056-31
https://doi.org/10.1201/9781003063056-31
Publikováno v:
Electron Microscopy and Analysis 1997 ISBN: 9781003063056
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5fc2a50b004e013852a4b660c86d34ad
https://doi.org/10.1201/9781003063056-26
https://doi.org/10.1201/9781003063056-26
Publikováno v:
Ultramicroscopy. 99:115-123
A new method for the accurate determination of the symmetric coefficients of the wave aberration function has been developed. The relative defoci and displacements of images in a focus series are determined from an analysis of the phase correlation f
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::dfeca1a194529a7c955658a5be5de680
https://doi.org/10.1016/j.ultramic.2003.11.001
https://doi.org/10.1016/j.ultramic.2003.11.001
Publikováno v:
Ultramicroscopy. 92:89-109
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b89fd1993cd40868ef9324d4b3e220b8
https://doi.org/10.1016/s0304-3991(02)00071-2
https://doi.org/10.1016/s0304-3991(02)00071-2
Autor:
W. O. Saxton, Angus I. Kirkland
Publikováno v:
Journal of Microscopy. 206:1-6
We report the characterization of the complex oxide Nb 1 6 W 1 1 8 O 9 4 using high angle annular dark field imaging at 200 kV in a scanning transmission electron microscope. The results of this study suggest that the W and Nb cations are not uniform
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7b65cf7097a6ef94c1991fa814a1a67f
https://doi.org/10.1046/j.1365-2818.2002.01002.x
https://doi.org/10.1046/j.1365-2818.2002.01002.x
Autor:
W. O. Saxton
Publikováno v:
Journal of Microscopy. 190:52-60
Many different measures are currently used for quantifying the difference between pairs of images. Those in common use are surveyed, their interrelationships are made clear and their dependence on transform band-width pointed out. Adaptations to imag
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1529ab9b9aa0c15b1caa591d72316206
https://doi.org/10.1046/j.1365-2818.1998.3380884.x
https://doi.org/10.1046/j.1365-2818.1998.3380884.x
Autor:
R. E. Dunin-Borkowski, W. O. Saxton
Publikováno v:
Acta Crystallographica Section A Foundations of Crystallography. 53:242-250
The electrostatic potential is determined both inside and outside a parallel-sided dielectric slab that contains a space charge layer whose plane is perpendicular to the surfaces of the slab, with particular reference to the use of phase-contrast tec
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a6b9d171f4f67fc3d7248b302f4ddabe
https://doi.org/10.1107/s0108767396015243
https://doi.org/10.1107/s0108767396015243
Autor:
W. O. Saxton
Publikováno v:
Journal of Microscopy. 179:201-213
SUMMARY Least-squares fitting methods are described, currently the most accurate known, for determining the imaging aberrations and other important parameters. The data required are either the image displacement or the image diffractogram shape (or b
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6dbb61e574ecd71914e45eaa60c435fd
https://doi.org/10.1111/j.1365-2818.1995.tb03633.x
https://doi.org/10.1111/j.1365-2818.1995.tb03633.x
Autor:
W. O. Saxton
Publikováno v:
Ultramicroscopy. 58:239-243
Optimal expressions are given for the estimation of three-fold astigmatism (and other aberrations) following measurement either of the image displacements or of the diffractogram shapes for sets of four images with mutually orthogonal injected beam t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2559f7a041884740962c3dd700e29537
https://doi.org/10.1016/0304-3991(95)00003-j
https://doi.org/10.1016/0304-3991(95)00003-j
Publikováno v:
Ultramicroscopy. 46:287-306
While compensation for local displacements of unit cells is now an accepted part of any attempt to determine high-resolution molecular structures by electron crystallography, the rotation and deformation that accompanies such displacements has not ye
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d11a558811f49c8bca0da8bd14c8b9d6
https://doi.org/10.1016/0304-3991(92)90020-k
https://doi.org/10.1016/0304-3991(92)90020-k