Zobrazeno 1 - 10 of 17 pro vyhledávání: '"W. Merlin"'
1
Elektronická kniha
Tonopah Test Range
Autor: Peter W. Merlin
Established by Sandia Corporation in 1957, Tonopah Test Range (TTR) in Nevada provided an isolated place for the Atomic Energy Commission and successor agencies to test ballistic characteristics and non-nuclear components of atomic bombs. Also known
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2
Elektronická kniha
Nevada Test Site
Autor: Peter W. Merlin
Since Pres. Harry Truman established the Nevada Test Site (NTS) in December 1950, it has played a vital role in the security of the United States. For four decades, the test site's primary purpose was developmental testing of nuclear explosives. Atmo
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4
Design and Development of the Blackbird: Challenges and Lessons Learned
Autor: Peter W. Merlin
Publikováno v: 47th AIAA Aerospace Sciences Meeting including The New Horizons Forum and Aerospace Exposition.
The Lockheed Blackbirds hold a unique place in the development of aeronautics. In their day, the A-12, YF-12, M-21, D-21, and SR-71 variants outperformed all other jet airplanes in terms of altitude and speed. Now retired, they remain the only produc
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::59128457d73a9245fb487df0981af12b
https://doi.org/10.2514/6.2009-1522
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6
Free Enterprise: Contributions of the Approach and Landing Test (ALT)Program to the Development of the Space Shuttle Orbiter
Autor: Peter W. Merlin
Publikováno v: Space 2006.
The space shuttle orbiter was the first spacecraft designed with the aerodynamic characteristics and in-atmosphere handling qualities of a conventional airplane. In order to evaluate the orbiter's flight control systems and subsonic handling characte
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::043729a487cc9e104216490418fe7ab6
https://doi.org/10.2514/6.2006-7467
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7
Contactless probing of high-frequency electrical signals with scanning probe microscopy
Autor: W. Merlin
Publikováno v: 2002 IEEE MTT-S International Microwave Symposium Digest (Cat. No.02CH37278).
Circuit internal test techniques working in a contactless manner are necessary for failure analysis and design verification of high-speed and high-frequency circuits. A relative new technique is the scanning probe voltage measurement technique, a tec
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::2bba4ad18e5505e64c751c9367171dbf
https://doi.org/10.1109/mwsym.2002.1012138
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