Zobrazeno 1 - 1
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pro vyhledávání: '"W. J. DeGuise"'
Publikováno v:
IBM Journal of Research and Development. 34:416-427
This paper describes the boundary-scan and built-in self-test (BIST) functions of the IBM token-ring local area network (LAN) adapter chip. These functions present a number of unique features. First, less that 1% of available standard cell circuits w
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::db225be979c0eb5207bf872043f2221b
https://doi.org/10.1147/rd.342.0416
https://doi.org/10.1147/rd.342.0416
