Zobrazeno 1 - 9
of 9
pro vyhledávání: '"W. H. Henkels"'
Publikováno v:
1998 IEEE International SOI Conference Proceedings (Cat No.98CH36199).
Design issues associated with dynamic circuits such as collisions, pulse widening, and noise margins are anticipated to be very sensitive to SOI process and device conditions. Multi-port dynamic register files and latches are important elements in cu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5f9c37f1bc9c48de1c1f3e62c22e4539
https://doi.org/10.1109/soi.1998.723146
https://doi.org/10.1109/soi.1998.723146
Autor:
W. H. Henkels
Publikováno v:
Journal of Applied Physics. 50:8143-8168
Fundamental design criteria for Josephson nondestructive readout random access memory (NDRO RAM) cells are presented, within the context of an LSI array environment. Emphasis is placed upon principles which are relevant to high performance. The crite
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::640825fcec56763c20ec7649b2a1d2b5
https://doi.org/10.1063/1.325955
https://doi.org/10.1063/1.325955
Publikováno v:
IBM Journal of Research and Development. 24:143-154
Design work on components for Josephson computer technology nondestructive read out cache memories has been published previously. In this paper, presenting a design for a 2.5-µm technology, 4 × 1K-bit cache chip with a nominal access time of about
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2b6358d3302a4a4f866f8c62185c033d
https://doi.org/10.1147/rd.242.0143
https://doi.org/10.1147/rd.242.0143
Publikováno v:
Journal of Applied Physics. 58:2379-2388
A detailed optimized design of a 1 K‐bit memory cell array with drivers and reset gates has been carried out based upon a set of projections for achievable tolerances in linewidths, resistances, and Josephson critical currents in a 2.5‐μm techno
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::46199c16d79c9ed1df2efa617ab50df5
https://doi.org/10.1063/1.335961
https://doi.org/10.1063/1.335961
Autor:
W. H. Henkels
Publikováno v:
Journal of Applied Physics. 57:855-860
In measurements of superconducting thin‐film penetration depths, the need for a reference penetration depth has been eliminated by a modification of the direct‐coupled SQUID technique. Furthermore, the technique is convenient for accurate measure
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::719560e937fda4c7b57b7e560793463c
https://doi.org/10.1063/1.334685
https://doi.org/10.1063/1.334685
Publikováno v:
Journal of Applied Physics. 58:2371-2378
This paper presents an overview of the status of a Josephson cache chip design at IBM in the Fall of 1983. Details of the design, organized as 1 K×4 bits, and employing a 2.5‐μm niobium edge‐junction technology, are found in the subsequent two
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::210e82dba00044845394486f78dd477c
https://doi.org/10.1063/1.335960
https://doi.org/10.1063/1.335960
Publikováno v:
Journal of Applied Physics. 58:2389-2399
Designs for peripheral and timing circuits for a Josephson cache memory chip, organized as 1 K × 4‐bits, are described. The designs were carried out employing a 2.5‐μm minimum‐linewidth niobium edge‐junction technology, in conjunction with
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d787f41792a01e01da3119dfee3c384b
https://doi.org/10.1063/1.336303
https://doi.org/10.1063/1.336303
Autor:
W. H. Henkels
Publikováno v:
Applied Physics Letters. 32:829-831
A technique for accurately measuring small superconductive inductances is presented. The inductance to be measured is inserted into a two‐junction interferometer into which control current is directly injected. The method was used to measure the pe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::957a9ae0b7c38df0ba071a051a2ce0a1
https://doi.org/10.1063/1.89940
https://doi.org/10.1063/1.89940
Publikováno v:
Applied Physics Letters. 29:214-216
The dc I‐V characteristics of superconducting thin‐film Sn‐Au proximity bridges and uniform‐thickness Sn microbridges have been carefully analyzed as a function of the directly measured current‐phase relation (CPR). At sufficiently low dc c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4855e6c5aab232b814418fd478155aea
https://doi.org/10.1063/1.88998
https://doi.org/10.1063/1.88998