Zobrazeno 1 - 10
of 175
pro vyhledávání: '"W. Hässler"'
Publikováno v:
Tagungsband.
Highly accurate dimensional metrology of nano structures are increasingly demanded for quality assurance in various nanomanufacturing industries. This paper presents some recent progresses on the developments of reference nanometrology at PTB based o
Publikováno v:
Wear. 257:1241-1245
Autor:
Andreas Schönecker, A. Sotnikov, Arved C. Hübler, Wolfgang S. Kreher, Lutz Seffner, Sylvia Gebhardt, S. Reuter, W. Beckert, W. Häßler, Johannes Rödel
Publikováno v:
Journal of the European Ceramic Society. 24:1101-1105
PZT thick films on various substrates are of great interest for applications as pressure sensors, micropumps, ultrasonic and pyroelectric transducers, deformable mirrors and ferroelectric printing forms. Until now, functional properties and microstru
Publikováno v:
Journal of the European Ceramic Society. 21:1341-1344
Dielectric properties of (1− x ) SrTiO 3 − x PbZrO 3 (0.5⩽ x ⩽1) ceramic solid solutions were studied at frequencies between 10 and 10 5 Hz in a wide temperature range. Polarization loop measurements were used to identify antiferroelectric (A
Publikováno v:
Microchimica Acta. 133:303-306
New BaTiO 3 -SrTiO 3 (BTO-STO)-superlattices which may be interesting for future electronic applications have been investigated by X-ray photoelectron spectroscopy (XPS) depth profiling. At first XPS measuring conditions were optimized for that non-c
Publikováno v:
Journal of the European Ceramic Society. 19:125-130
Thick YBCO-films were prepared on single crystalline SrTiO3(001) and LaAlO3(001) substrates by the dip-coating process starting with Y-, Ba- and Cu-acetylacetonates. When a characteristic temperature during transformation of the precursor into YBa2Cu
Autor:
W Häßler-Grohne, H Bosse
Publikováno v:
Measurement Science and Technology. 9:1120-1128
The demands on the uncertainties of pattern placement and overlay measurements in lithography are constantly growing due to the continuing reduction of feature size which allows higher density integration. Although nowadays optical projection lithogr
Publikováno v:
Ferroelectrics. 201:65-74
Thin films of Ba1-xSrxTiO3 were prepared by off-axis laser deposition on MgO (001) and YBa2Cu3O7-δ coated SrTiO3 (001) substrates. X-ray diffraction in Θ-2Θ geometry shows (001) oriented film growth of Ba1-xSrxTiO3. The epitaxial film growth was p
Publikováno v:
Ferroelectrics. 186:199-202
The materials investigated in this paper are PZT-thick-films on polycrystalline Al2O3-substrates metallized with a Pt-electrode. Measurements of the surface potential of locally polarized films with an electrostatic voltmeter with a lateral resolutio
Publikováno v:
Physica Status Solidi (a). 156:199-207
Ferroelectric thick PZT coatings have been produced with rhombohedral crystalline structure by plasma-spraying of PZT powder (x = 0.58) and post-deposition thermal treatment. The correlation of the crystalline phase composition and the morphological