Zobrazeno 1 - 10
of 104
pro vyhledávání: '"W. Braue"'
Publikováno v:
Journal of the European Ceramic Society. 16:85-97
Planar specimens prepared from thin plasmasprayed Mg-Al spinel and 2 1 -mullite layers are investigated via conventional and analytical transmission electron microscopy in order to evaluate the constraints of rapid solidification on the in-plane micr
Publikováno v:
Journal of the American Ceramic Society. 78:2579-2592
The extent of chemical distributions into crystals bounding whisker/matrix interfaces and matrix grain boundaries and the lateral continuity of the distributions was investigated by analytical electron microscopy methods and compared to their structu
Publikováno v:
Microscopy Microanalysis Microstructures. 6:587-599
The spatial extent of chemical solute distributions that formed in interfaces between platinum or silicon nitride and silicon carbide or in silicon nitride grain boundaries during high temperature processing of these composites has been investigated
Publikováno v:
Journal of Materials Science. 29:1265-1275
A correlation of densification behaviour and microstructural development of ZrO2-fluxed sintered reaction-bonded Si3N4 (SRBSN) is reported in the light of dilatometry and both high-resolution electron microscopy (HREM) and analytical electron microsc
Thermal barrier coating (TBC) recession mechanisms caused by CaSO4 and Fe –Ti – rich CaO– MgO–Al2O3 –SiO2 (CMAS) (FTCMAS) particles on an in-service electron-beam physical vapour deposited (EB-PVD)...
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::20760b5aafcc9c228f7d7c6404ccb2a0
https://elib.dlr.de/76111/
https://elib.dlr.de/76111/
Publikováno v:
Key Engineering Materials. :641-646
Publikováno v:
Key Engineering Materials. :483-488
Publikováno v:
Ultramicroscopy. 40:229-239
Silicon nitride/silicon carbide(w) ceramic matrix composites synthesized from common starting materials, except for the whiskers themselves, under the same processing conditions have been investigated. High-resolution electron microscopy and high-spa
Publikováno v:
Journal of Materials Research. 6:1937-1944
Transmission electron microscopy was used to characterize microstructures of SiC densified using a transient liquid phase (resulting from the reaction of Al2O3 with Al4C3) by hot pressing at 1875 °C for 10 min in N2. High resolution electron microsc
Autor:
W. Braue, Ray Carpenter
Publikováno v:
Journal of Materials Science. 25:2943-2948
Intragranular inclusions and multiphase regions at triple grain junctions in (B+C)-doped sintered α-SiC were investigated using analytical and high-resolution electron microscopy. Both regions were two-phase, composed of graphite and amorphous mater