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pro vyhledávání: '"W. Arrheier"'
Publikováno v:
DDECS
The paper presents an efficient crosstalk simulator tool "XSIM" and it's methodology for analysis and modeling of signal integrity faults in deep sub-micron chips. The tool is used for analyzing the crosstalk coupling behavior in both defective and d
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::75798c59adc7b476f70584d10a154e23
https://doi.org/10.1109/ddecs.2007.4295274
https://doi.org/10.1109/ddecs.2007.4295274
