Výsledky vyhledávání - "W. A. Schoonveld"

Single crystallites in 'planar polycrystalline' oligothiophene films: Determination of orientation and thickness by polarization microscopy

Autor: W. A. Schoonveld, R. Veldman, J. Vrijmoeth, T. M. Klapwijk, R. W. Stok

Publikováno v: Journal of Applied Physics, 83(7), 3816-3824. AMER INST PHYSICS

Thin films of evaporated oligothiophenes (alpha-nT, n = 4-8) show a "planar polycrystalline" structure: each of the individual crystallites has a random azimuthal orientation, the (a, b) face of its unit cell is aligned with the surface plane, We int

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1ee69c5db72405776979910e914d8bcf
https://doi.org/10.1063/1.367145

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Intrinsic charge transport properties of an organic single crystal determined using a multiterminal thin-film transistor

Autor: T. M. Klapwijk, J. Vrijmoeth, W. A. Schoonveld

Publikováno v: Applied Physics Letters, 73(26), 3884-3886

We present an experimental approach to determine the intrinsic field-effect mobility in an organic single crystal as a function of the in-plane crystal-axis direction. Using a multiterminal geometry the experiment also excludes the effects of the con

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0aba1eb79f9530c4fa743a0bd9a1f8c9
https://hdl.handle.net/11370/c81e814f-31fb-4b22-b326-fbc3958ad35f

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Coulomb-blockade transport in single-crystal organic thin-film transistors

Autor: T. M. Klapwijk, PA Peter Bobbert, Denis Fichou, B. J. van Wees, W. A. Schoonveld, J. Wildeman

Publikováno v: Nature, 404(6781), 977-980. Nature Publishing Group

Coulomb-blockade transport--whereby the Coulomb interaction between electrons can prohibit their transport around a circuit--occurs in systems in which both the tunnel resistance, Rb between neighbouring sites is large (h/e2) and the charging energy,

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::09db03d7179d3f56b034d146c4db2d02
https://research.tue.nl/nl/publications/757135c1-b361-4f61-84da-268b32104218

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Morphology identification of the thin film phases of vacuum evaporated pentacene on SIO2 substrates

Autor: W. A. Schoonveld, T. M. Klapwijk, I.P.M. Bouchoms, J. Vrijmoeth

Publikováno v: Synthetic Metals, 104(3), 175-178. Elsevier Science

We identify, using Atomic Force Microscopy and θ –2 θ X-ray Diffraction techniques, the morphology of the two crystallographic phases commonly observed in vacuum evaporated pentacene thin films on SiO 2 substrates used for thin film transistor ap

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::dac188712d35c104d6a7446fc836a5b6
https://research.rug.nl/en/publications/f6e8706e-ed08-4ad9-9799-1ca184ca4d51

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Morphology of quaterthiophene thin films in organic field effect transistors

Autor: J. Wildeman, W. A. Schoonveld, T. M. Klapwijk, J.W Weijtmans, J. Vrijmoeth, R. W. Stok

Publikováno v: Synthetic Metals, 84(1-3), 583-584. Elsevier Science

The morphology of vacuum evaporated unsubstituted quaterthiophene films is studied as a function of the evaporation parameters. X-ray diffraction and AFM studies show that the thin film has a layered structure. Upon increasing the substrate temperatu

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c010ac5244d0bf5e783744903d218beb
https://doi.org/10.1016/s0379-6779(97)80867-3

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