Zobrazeno 1 - 10
of 49
pro vyhledávání: '"W H Weber"'
Autor:
Boileau James Maurice, Wen Yang, Somnath Ghosh, W. H. Weber, Ann E. O'Neill, Bhaskar Majumdar, Peter A. Gustafson, Stephen J. Harris
Publikováno v:
Journal of Applied Physics. 96:7195-7201
Micro-Raman spectroscopy has been widely used to measure local stresses in silicon and other cubic materials. However, a single (scalar) line position measurement cannot determine the complete stress state unless it has a very simple form such as uni
Publikováno v:
Journal of Physics: Condensed Matter. 12:6725-6734
Using the full-potential linearized augmented-plane-wave (FLAPW) method, the mechanism of the rutile-CaCl2 phase transition of RuO2 and the phase stability of β-PtO2 are investigated. The local density functional calculations predict quantities such
Publikováno v:
Journal of Physics D: Applied Physics. 31:1963-1967
The surface tension of detached liquid drops in pulsed gas metal arc welding was determined in situ from the period of the prolate-oblate oscillations initiated by the detachment event. The oscillating drops were imaged by an optical shadowgraph tech
Publikováno v:
Journal of Applied Physics. 84:2011-2017
Low-temperature (∼200 °C) molecular beam epitaxy of Ge-rich Ge1−x−ySiyCx alloys grown on Si(100) have been investigated by in situ reflection high-energy electron diffraction, ex situ x-ray diffraction, transmission electron microscopy, Raman
Publikováno v:
Journal of Applied Physics. 83:2820-2825
Silicon-containing amorphous hydrogenated carbon films deposited by a plasma-enhanced chemical vapor deposition process were studied using both Raman and ellipsometry spectroscopies. Analyses of the experimental data from both these techniques yielde
Publikováno v:
Journal of Applied Physics. 82:3287-3296
Low-temperature (∼200 °C) molecular beam epitaxy of Ge1−xCx alloys grown on Si(100) have been extensively investigated by in situ reflection high-energy electron diffraction, ex situ x-ray diffraction, transmission electron microscopy, and Raman
Publikováno v:
Applied Spectroscopy. 51:123-129
We demonstrate the use of Raman microscopy for leak detection in hermetically sealed micromachined accelerometers. Leaks were indicated by the presence of a foreign gas, in this case oxygen, in the 70-μm-deep cavity enclosing the accelerometer betwe
Publikováno v:
Journal of Applied Physics. 73:2977-2982
A simple laser reflective interferometer has been employed for in situ monitoring of diamond film growth in a hot‐filament chemical vapor deposition reactor. This method uses a low power HeNe laser beam reflected at normal incident from the substra
Publikováno v:
Optics letters. 2(6)
Publikováno v:
Physical Review B. 41:7822-7827
We report measurements of the effects of high pressure and O-isotope substitution on the Raman spectrum of \ensuremath{\alpha}-${\mathrm{Fe}}_{2}$${\mathrm{O}}_{3}$. Spectra for the pressure effects were obtained from single crystals in a diamond-anv