Zobrazeno 1 - 3
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pro vyhledávání: '"W H Kirchhoff"'
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 4:1666-1670
The composition versus depth distribution of a solid/solid interface as determined by Auger sputter depth profiling can be described by a logistic function of the form Y=[A+a(T−T0)]/(1+ex) +[B+b(T−T0)]/(1+e−x), where Y is a measure of the eleme
Publikováno v:
The Journal of Chemical Physics. 42:1410-1422
The π‐electron energies of the formyloxy cation, radical, and anion (formate ion) have been calculated using several methods. The use of wavefunctions in which the individual electrons were placed in nonpaired spatial orbitals gave a substantial i