Zobrazeno 1 - 10
of 72
pro vyhledávání: '"W C Nixon"'
Autor:
A, Eckstein, W C, Nixon
Publikováno v:
British medical journal. 1
Autor:
W C, Nixon
Publikováno v:
Proceedings of the Royal Society of Medicine. 27(11)
Publikováno v:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 8:2048
A new beam deflection‐chopping system has been developed which circumvents the limitation of electron pulse generation at maximum repetition rates of a few GHz with low energy beams using conventional deflection‐chopping techniques. In an electro
Autor:
W. C. Nixon, V. R. M. Rao
Publikováno v:
Journal of Vacuum Science and Technology. 19:1037-1041
The influence of fifth‐order deflection aberrations for purely magnetic post lens single‐deflection systems has been investigated. A regrouping of the large numbers of third‐ and fifth‐order aberration coefficients has been performed to reduc
Optimisation and applications of the Cambridge University 600 kV high resolution electron microscope
Autor:
R. A. Camps, W. O. Saxton, L. A. Freeman, J. R. A. Cleaver, A.E. Timbs, David J. Smith, C. J. D. Catto, W. C. Nixon, V. E. Cosslett, H. Ahmed, K.C.A. Smith
Publikováno v:
Ultramicroscopy. 9:203-213
The Cambridge University 600 kV high resolution electron microscope is currently operating with a directly interpretable image resolution of close to 2 A. Following a brief outline of salient features of this HREM which have proven crucial to optimis
Publikováno v:
IEEE Transactions on Electron Devices. 19:641-646
Computer-aided design techniques are now used extensively for the production of masks in the microelectronic industries. In these methods the microcircuit patterns are broken down into simpler component parts, such as rectangles, whose co-ordinates a
Autor:
W. C. Nixon
Publikováno v:
Philosophical Transactions of the Royal Society of London. B, Biological Sciences. 261:45-50
In the transmission electron microscope, as shown in figure 1 (Nixon 1962), the electron gun at the top illuminates the specimen with the beam angle controlled by the condenser lens. The lenses below the specimen are used to magnify the image of the
Autor:
W. C. Nixon
Publikováno v:
Proceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences. 232:475-485
The X-ray shadow projection microscope has been limited previously to a resolution of 0$\cdot $5 $\mu $. A resolution of 0$\cdot $1 $\mu $ has now been achieved with the same exposure time of 5 min. This has been done by using a very thin gold-leaf X
Autor:
W C Nixon, M E Barnett
Publikováno v:
Journal of Scientific Instruments. 44:893-898
The principle of mirror electron microscopy is explained and the geometrical optics of the objective stage of such a microscope are discussed. The construction of an electron optical column for use as a mirror electron microscope is described. Magnif
Autor:
J. P. Ballantyne, W. C. Nixon
Publikováno v:
Journal of Vacuum Science and Technology. 10:1094-1097
Direct metallic deposition exploits the advantages of electron-beam exposure for the production of fine structures and avoids the use of resists and chemical etching. The process involves the electron-induced decomposition of metallic compounds in ar