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Publikováno v:
Current Science, 1961 Aug 01. 30(8), 315-316.
Externí odkaz:
https://www.jstor.org/stable/24059438
Autor:
Haine, M. E.
Publikováno v:
Science Progress (1933- ), 1962 Jul 01. 50(199), 486-486.
Externí odkaz:
https://www.jstor.org/stable/43425357
Autor:
A, Eckstein, W C, Nixon
Publikováno v:
British medical journal. 1
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid_dedup__::2cef251dd9bfc7062602c4439b131ef2
https://pubmed.ncbi.nlm.nih.gov/21018906
https://pubmed.ncbi.nlm.nih.gov/21018906
Autor:
W C, Nixon
Publikováno v:
Proceedings of the Royal Society of Medicine. 27(11)
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::31364459b5f62d7f75d0c90f31912b20
https://pubmed.ncbi.nlm.nih.gov/20914362
https://pubmed.ncbi.nlm.nih.gov/20914362
Publikováno v:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 8:2048
A new beam deflection‐chopping system has been developed which circumvents the limitation of electron pulse generation at maximum repetition rates of a few GHz with low energy beams using conventional deflection‐chopping techniques. In an electro
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::77d82f9a12776969687729df2b104a7a
https://doi.org/10.1116/1.584872
https://doi.org/10.1116/1.584872
Autor:
W. C. Nixon, V. R. M. Rao
Publikováno v:
Journal of Vacuum Science and Technology. 19:1037-1041
The influence of fifth‐order deflection aberrations for purely magnetic post lens single‐deflection systems has been investigated. A regrouping of the large numbers of third‐ and fifth‐order aberration coefficients has been performed to reduc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::83090c52de5e6106c534f078a6dba2ba
https://doi.org/10.1116/1.571164
https://doi.org/10.1116/1.571164
Optimisation and applications of the Cambridge University 600 kV high resolution electron microscope
Autor:
R. A. Camps, W. O. Saxton, L. A. Freeman, J. R. A. Cleaver, A.E. Timbs, David J. Smith, C. J. D. Catto, W. C. Nixon, V. E. Cosslett, H. Ahmed, K.C.A. Smith
Publikováno v:
Ultramicroscopy. 9:203-213
The Cambridge University 600 kV high resolution electron microscope is currently operating with a directly interpretable image resolution of close to 2 A. Following a brief outline of salient features of this HREM which have proven crucial to optimis
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4b0909f4951cbc95d9db5a7739b9f92d
https://doi.org/10.1016/0304-3991(82)90201-7
https://doi.org/10.1016/0304-3991(82)90201-7