Zobrazeno 1 - 10
of 711
pro vyhledávání: '"W A Weber"'
Autor:
E. Lopci, N. Aide, A. Dimitrakopoulou-Strauss, L. Dercle, A. Iravani, R. D. Seban, C. Sachpekidis, O. Humbert, O. Gheysens, A. W. J. M. Glaudemans, W. A. Weber, A. D. Van den Abbeele, R. L. Wahl, A. M. Scott, N. Pandit-Taskar, R. J. Hicks
Publikováno v:
Cancer Imaging, Vol 22, Iss 1, Pp 1-5 (2022)
Abstract Response assessment in the context of immunomodulatory treatments represents a major challenge for the medical imaging community and requires a multidisciplinary approach with involvement of oncologists, radiologists, and nuclear medicine sp
Externí odkaz:
https://doaj.org/article/c96e88f188af49569f27582b906b77e7
Publikováno v:
JPhys Materials, Vol 7, Iss 2, p 021001 (2024)
Compositionally complex materials have demonstrated extraordinary promise for structural robustness in extreme environments. Of these, the most commonly thought of are high entropy alloys, where chemical complexity grants uncommon combinations of har
Externí odkaz:
https://doaj.org/article/c62c285f38a94d33a2ea69a6b2142897
Autor:
Roland W. S. Weber, Antonios Petridis
Publikováno v:
BioTech, Vol 12, Iss 4, p 64 (2023)
Grey mould, caused by Botrytis cinerea and other Botrytis spp., is a major cause of fruit rot in strawberries and other fruit crops worldwide. Repeated fungicide applications are essential in order to secure harvests. However, resistance to all curre
Externí odkaz:
https://doaj.org/article/55ae011a787a47ab827d1c93faa2e2b6
Autor:
S. K. B. Spohn, S. Adebahr, M. Huber, C. Jenkner, R. Wiehle, B. Nagavci, C. Schmucker, E. G. Carl, R. C. Chen, W. A. Weber, M. Mix, A. Rühle, T. Sprave, N. H. Nicolay, C. Gratzke, M. Benndorf, T. Wiegel, J. Weis, D. Baltas, A. L. Grosu, C. Zamboglou
Publikováno v:
BMC Cancer, Vol 22, Iss 1, Pp 1-15 (2022)
Abstract Objective Failure rate in randomized controlled trials (RCTs) is > 50%, includes safety-problems, underpowered statistics, lack of efficacy, lack of funding or insufficient patient recruitment and is even more pronounced in oncology trials.
Externí odkaz:
https://doaj.org/article/4df0f24edbe84ea191fc61feb426fbb3
Autor:
Roland W. S. Weber, Jorunn Børve
Publikováno v:
CABI Agriculture and Bioscience, Vol 2, Iss 1, Pp 1-16 (2021)
Abstract Background European canker, caused by Neonectria ditissima, is a disease of worldwide importance in apple production, yet knowledge about it is limited, highly regional and sometimes contradictory. This is an obstacle to successful disease m
Externí odkaz:
https://doaj.org/article/bac684dedd2645348bf001a05f628fb9
Publikováno v:
Materials Research Letters, Vol 7, Iss 7, Pp 298-303 (2019)
The origin of the blue emission in SrTiO3 has been investigated as a function of irradiation fluence, electronic excitation density, and temperature using a range of ion energies and masses. The emission clearly does not show correlation with the con
Externí odkaz:
https://doaj.org/article/aaa272dea44142d5bb5cf88b210190e0
Autor:
G. Velişa, F. Granberg, E. Levo, Y. Zhou, Z. Fan, H. Bei, F. Tuomisto, K. Nordlund, F. Djurabekova, W. J. Weber, Y. Zhang
Publikováno v:
Journal of Materials Research. 38:1510-1526
Publikováno v:
Ecology and Evolution, Vol 8, Iss 16, Pp 8197-8203 (2018)
Abstract When females mate with multiple partners in a reproductive cycle, the relative number of competing sperm from rival males is often the most critical factor in determining paternity. Gamete production is directly related to testis size in mos
Externí odkaz:
https://doaj.org/article/b4f8921ce1f448fd97a41e2ad2a35bd3
Publikováno v:
Materials Research Letters, Vol 6, Iss 2, Pp 136-141 (2018)
A combined experimental and computational evaluation of damage accumulation in ion-irradiated Ni, NiFe, and NiFeCoCr is presented. A suppressed damage accumulation, at early stages (low-fluence irradiations), is revealed in NiFeCoCr, with a linear de
Externí odkaz:
https://doaj.org/article/d345f216f61f472db6774c542a8f8139
Autor:
B. LaRiviere, P. Ramuhalli, F. K. Reed, P. C. Joshi, M. N. Ericson, T. Aytug, M. L. Crespillo, S. J. Zinkle, W. J. Weber, E. Zarkadoula
Publikováno v:
IEEE Transactions on Device and Materials Reliability. 22:493-499