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of 488
pro vyhledávání: '"Vurpillot F"'
Autor:
Morgado, F. F., Stephenson, L. T., Bhatt, S., Freysoldt, C., Neumeier, S., Katnagallu, S., Subramanyam, A. P. A., Pietka, I., Hammerschmidt, T., Vurpillot, F., Gault, B.
Stacking faults (SF) are important structural defects that play an essential role in the deformation of engineering alloys. However, direct observation of stacking faults at the atomic scale can be challenging. Here, we use the analytical field ion m
Externí odkaz:
http://arxiv.org/abs/2408.03167
Autor:
Hunnestad, K.A., Hatzoglou, C., Vurpillot, F., Nylund, I.-E., Yan, Z., Bourret, E., van Helvoort, A.T.J., Meier, D.
Publikováno v:
In Materials Characterization September 2023 203
We have recently proposed an atom probe design based on a femtosecond time-resolved pump-probe setup. This setup unlocks the limitation of voltage pulsed mode atom probe thanks to the occurrence of local photoconductive switching effect . In this pap
Externí odkaz:
http://arxiv.org/abs/1607.02127
Publikováno v:
Current Opinion in Solid State and Materials Science Volume 17 Issue 5 October 2013 Pages 236 247
In this review we present an overview of the current atom probe tomography spatial data reconstruction paradigm, and explore some of potential routes to improve the current methodology in order to yield a more accurate representation of nanoscale mic
Externí odkaz:
http://arxiv.org/abs/1510.02843
Autor:
Dubosq, R., Gault, B., Hatzoglou, C., Schweinar, K., Vurpillot, F., Rogowitz, A., Rantitsch, G., Schneider, D.A.
Publikováno v:
In Ultramicroscopy November 2020 218
Akademický článek
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A detailed interface study was conducted on a Fe/MgO/Fe system using laser assisted 3D atom probe. It exhibits an additional oxide formation at the second interface of the multilayer structure independent of laser wavelength, laser fluence and the th
Externí odkaz:
http://arxiv.org/abs/1105.5099
Publikováno v:
Surface and Interface Analysis 39, 2-3 (2007) 268--272
A new 3DAP reconstruction procedure is proposed that accounts for the evaporation field of a secondary phase. It applies the existing cluster selection software to identify the atoms of the second phase and, subsequently, an iterative algorithm to ho
Externí odkaz:
http://arxiv.org/abs/0907.5067
Autor:
Vurpillot, F, Nulli, S, Danoix, R, Prosa, T J, Chen, Y, Reinhard, D, Martin, I, Ulfig, R, Larson, D J
Publikováno v:
Microscopy & Microanalysis; 2024 Supplement, Vol. 30, p1-4, 4p
Autor:
Barnes, J.P., Grenier, A., Mouton, I., Barraud, S., Audoit, G., Bogdanowicz, J., Fleischmann, C., Melkonyan, D., Vandervorst, W., Duguay, S., Rolland, N., Vurpillot, F., Blavette, D.
Publikováno v:
In Scripta Materialia 15 April 2018 148:91-97