Stacking fault segregation imaging with analytical field ion microscopy

Autor: Morgado, F. F., Stephenson, L. T., Bhatt, S., Freysoldt, C., Neumeier, S., Katnagallu, S., Subramanyam, A. P. A., Pietka, I., Hammerschmidt, T., Vurpillot, F., Gault, B.

Stacking faults (SF) are important structural defects that play an essential role in the deformation of engineering alloys. However, direct observation of stacking faults at the atomic scale can be challenging. Here, we use the analytical field ion m

Externí odkaz: http://arxiv.org/abs/2408.03167

Numeric modeling of synchronous laser pulsing and voltage pulsing field evaporation

Autor: Zhao, L., Normand, A., Houard, J., Blum, I., Delaroche, F., Vurpillot, F.

We have recently proposed an atom probe design based on a femtosecond time-resolved pump-probe setup. This setup unlocks the limitation of voltage pulsed mode atom probe thanks to the occurrence of local photoconductive switching effect . In this pap

Externí odkaz: http://arxiv.org/abs/1607.02127

Stacking Fault Segregation Imaging With Analytical Field Ion Microscopy.

Autor: F Morgado F; Max-Planck-Institut für Eisenforschung, Max-Planck-Str. 1, Düsseldorf 40237, Germany., Stephenson LT; Max-Planck-Institut für Eisenforschung, Max-Planck-Str. 1, Düsseldorf 40237, Germany., Bhatt S; Max-Planck-Institut für Eisenforschung, Max-Planck-Str. 1, Düsseldorf 40237, Germany., Freysoldt C; Max-Planck-Institut für Eisenforschung, Max-Planck-Str. 1, Düsseldorf 40237, Germany., Neumeier S; Friedrich-Alexander-Universität Erlangen-Nürnberg, Materials Science and Engineering, Institute 1, Martensstrasse 5, Erlangen 91058, Germany., Katnagallu S; Max-Planck-Institut für Eisenforschung, Max-Planck-Str. 1, Düsseldorf 40237, Germany., Subramanyam APA; Interdisciplinary Centre for Advanced Materials Simulation, Ruhr-Universität Bochum, Universitätstr. 150, Bochum 44801, Germany., Pietka I; Interdisciplinary Centre for Advanced Materials Simulation, Ruhr-Universität Bochum, Universitätstr. 150, Bochum 44801, Germany., Hammerschmidt T; Interdisciplinary Centre for Advanced Materials Simulation, Ruhr-Universität Bochum, Universitätstr. 150, Bochum 44801, Germany., Vurpillot F; Normandie Université, UNIROUEN, INSA Rouen, CNRS, Groupe de Physique des Matériaux, Rouen 76000, France., Gault B; Max-Planck-Institut für Eisenforschung, Max-Planck-Str. 1, Düsseldorf 40237, Germany.; Department of Materials, Royal School of Mines, Imperial College London, Prince Consort Rd, South Kensington, London SW7 2AZ, UK.

Publikováno v: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada [Microsc Microanal] 2024 Nov 13. Date of Electronic Publication: 2024 Nov 13.

Analysis of nanoscale fluid inclusions in geomaterials by atom probe tomography: Experiments and numerical simulations

Autor: Dubosq, R., Gault, B., Hatzoglou, C., Schweinar, K., Vurpillot, F., Rogowitz, A., Rantitsch, G., Schneider, D.A.

Publikováno v: In Ultramicroscopy November 2020 218

Interface study of FeMgOFe magnetic tunnel junctions using 3D Atom Probe

Autor: Mazumder, B., Gruber, M., Vella, A., Vurpillot, F., Deconihout, B.

A detailed interface study was conducted on a Fe/MgO/Fe system using laser assisted 3D atom probe. It exhibits an additional oxide formation at the second interface of the multilayer structure independent of laser wavelength, laser fluence and the th

Externí odkaz: http://arxiv.org/abs/1105.5099