Výsledky vyhledávání - "Vrignon, Bertrand"

A new approach to modelling the impact of EMI on MOSFET DC behavior

Autor: Fernández García, Raúl, Gil Galí, Ignacio, Boyer, A., BenDhia, S., Vrignon, Bertrand

Publikováno v: UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
Recercat. Dipósit de la Recerca de Catalunya
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A simple analytical model to predict the DC MOSFET behavior under electromagnetic interference (EMI) is presented. The model is able to describe the MOSFET performance in the linear and saturation regions under EMI disturbance applied to the gate. Th

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::25422302db25fb4aa146ceb4b08bf00c
https://hdl.handle.net/2117/14375

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An On-Chip Sensor for Time Domain Characterization of Electromagnetic Interferences

Autor: Boyer, Alexandre, Ben Dhia, Sonia, Lemoine, Christophe, Vrignon, Bertrand

Publikováno v: 8th Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo)
8th Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo), Nov 2011, Dubrovnik, Croatia. pp.251

International audience; With the growing concerns about susceptibility of integrated circuits to electromagnetic interferences, the need for accurate prediction tools and models to reduce risks of noncompliance becomes critical for circuit designers.

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::b27a7b5b078e1150b99a30042f33ba51
https://hal.archives-ouvertes.fr/hal-00669533/document

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Construction and Evaluation of the Susceptibility Model of an Integrated Phase-Locked Loop

Autor: Boyer, Alexandre, Ben Dhia, Sonia, Lemoine, Christophe, Vrignon, Bertrand

Publikováno v: 8th Workshop on Electromagnetic Compatibility of Itnegrated Circuits
8th Workshop on Electromagnetic Compatibility of Itnegrated Circuits, Nov 2011, Dubrovnik, Croatia. pp.7

6 pages; International audience; Developing integrated circuit immunity models has become one of the major concerns of integrated circuits suppliers to predict whether a chip will pass susceptibility tests before fabrication and avoid redesign proces

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::ee994514bb5d03f7b00a1c649c76467b
https://hal.archives-ouvertes.fr/hal-00669716/file/06130042.pdf

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Conference

Prediction of aging impact on electromagnetic susceptibility of an operational amplifier.

Autor: Huang, He, Boyer, Alexandre, Ben Dhia, Sonia, Vrignon, Bertrand

Publikováno v: 2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC); 2015, p86-89, 4p

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Conference

Electromagnetic analysis, deciphering and reverse engineering of integrated circuits (E-MATA HARI).

Autor: Chusseau, Laurent, Omarouayache, Rachid, Raoult, Jeremy, Jarrix, Sylvie, Maurine, Philippe, Tobich, Karim, Bover, Alexandre, Vrignon, Bertrand, Shepherd, John, Le, Thanh-Ha, Berthier, Mael, Riviere, Lionel, Robisson, Bruno, Ribotta, Anne-Lise

Publikováno v: 2014 22nd International Conference on Very Large Scale Integration (VLSI-SoC); 2014, p1-6, 6p

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