Výsledky vyhledávání - "Von Borany, Johannes"

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Site-controlled formation of single Si nanocrystals in a buried SiO2 matrix using ion beam mixing

Autor: Xu, Xiaomo, Prüfer, Thomas, Wolf, Daniel, Engelmann, Hans-Jürgen, Bischoff, Lothar, Hübner, René, Heinig, Karl-Heinz, Möller, Wolfhard, Facsko, Stefan, von Borany, Johannes, Hlawacek, Gregor

Publikováno v: Beilstein Journal of Nanotechnology 9 (2018) 2883-2892

For future nanoelectronic devices - such as room-temperature single electron transistors - the site-controlled formation of single Si nanocrystals (NCs) is a crucial prerequisite. Here, we report an approach to fabricate single Si NCs via medium-ener

Externí odkaz: http://arxiv.org/abs/1910.04389

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Morphology modifcation of Si nanopillars under ion irradiation at elevated temperatures: plastic deformation and controlled thinning to 10 nm

Autor: Xu, Xiaomo, Heinig, Karl-Heinz, Möller, Wolfhard, Engelmann, Hans-Jürgen, Klingner, Nico, Gharbi, Ahmed, Tiron, Raluca, von Borany, Johannes, Hlawacek, Gregor

Si nanopillars of less than 50 nm diameter have been irradiated in a helium ion microscope with a focused Ne$^+$ beam. The morphological changes due to ion beam irradiation at room temperature and elevated temperatures have been studied with the tran

Externí odkaz: http://arxiv.org/abs/1906.09975

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Road to micron resolution with a color X-ray camera -- polycapillary optics characterization

Autor: Nowak, Stanisław H., Petric, Marko, Buchriegler, Josef, Bjeoumikhov, Aniouar, Bjeoumikhov, Zemfira, von Borany, Johannes, Munnik, Frans, Radtke, Martin, Renno, Axel D., Reinholz, Uwe, Scharf, Oliver, Tilgner, Joachim, Wedell, Reiner

In a color X-ray camera, spatial resolution is achieved by means of a polycapillary optic conducting X-ray photons from small regions on a sample to distinct energy dispersive pixels on a CCD matrix. At present, the resolution limit of color X-ray ca

Externí odkaz: http://arxiv.org/abs/1705.08939

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Nanometer scale elemental analysis in the helium ion microscope using time of flight spectrometry

Autor: Klingner, Nico, Heller, René, Hlawacek, Gregor, von Borany, Johannes, Notte, John, Huang, Jason, Facsko, Stefan

Time of flight backscattering spectrometry (ToF-BS) was successfully implemented in a helium ion microscope (HIM). Its integration introduces the ability to perform laterally resolved elemental analysis as well as elemental depth profiling on the nm

Externí odkaz: http://arxiv.org/abs/1510.04594

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Sub-pixel resolution with color X-ray camera SLcam(R)

Autor: Nowak, Stanisław H., Bjeoumikhov, Aniouar, von Borany, Johannes, Buchriegler, Josef, Munnik, Frans, Petric, Marko, Radtke, Martin, Renno, Axel D., Reinholz, Uwe, Scharf, Oliver, Wedell, Reiner

Publikováno v: J.Anal.At.Spectrom. 30 (2015) 1890-1897

The color X-ray camera SLcam(R) is a full-field, single photon detector providing scanning free, energy and spatially resolved X-ray imaging. Spatial resolution is achieved with the use of polycapillary optics guiding X-ray photons from small regions

Externí odkaz: http://arxiv.org/abs/1501.06825

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