Zobrazeno 1 - 10
of 17
pro vyhledávání: '"Vojtěch Svatoš"'
Autor:
Petra Majzlíková, Jiří Sedláček, Jan Prášek, Jan Pekárek, Vojtěch Svatoš, Alexander G. Bannov, Ondřej Jašek, Petr Synek, Marek Eliáš, Lenka Zajíčková, Jaromír Hubálek
Publikováno v:
Sensors, Vol 15, Iss 2, Pp 2644-2661 (2015)
Vertically aligned multi-walled carbon nanotubes (VA-MWCNTs) with an average diameter below 80 nm and a thickness of the uniform VA-MWCNT layer of about 16 µm were grown in microwave plasma torch and tested for selected functional properties. IR abs
Externí odkaz:
https://doaj.org/article/687b0d8d70d3452ca369e38bd05ee211
Autor:
Imrich Gablech, Jan Pekárek, Jaroslav Klempa, Petr Vyroubal, Vojtěch Svatoš, and Pavel Neužil
Publikováno v:
Proceedings, Vol 2, Iss 13, p 1513 (2018)
This paper proposes a new method for characterization of 2D materials under the precisely specified conditions. It is achieved by integration of a 2D material as a field effect transistors structures with a piezoelectric resonator. Properties of the
Externí odkaz:
https://doaj.org/article/8e476f8e636f4b5aa2fad1d93b1dcc3e
Autor:
Imrich Gablech, Jan Pekárek, Ondřej Caha, Vojtěch Svatoš, Pavel Neužil, Jaroslav Klempa, Michael Schneider, Tomáš Šikola, Adam Dubroka
Publikováno v:
Thin Solid Films. 670:105-112
We proposed and demonstrated a preparation method of (001) preferentially oriented stress-free AlN piezoelectric thin films. The AlN thin films were deposited by a reactive sputtering technique at substrate temperatures up to 330 °C using a dual Kau
Publikováno v:
TrAC Trends in Analytical Chemistry. 109:43-49
Microcalorimetry has been widely used to measure and characterize the heat change in phase transition, resolution mixing, and chemical/biochemical reactions. In this review, we discuss progress in the development of high-performance microfabricated c
Publikováno v:
Infrared Physics & Technology. 93:286-290
Determination of microbolometer thermal properties such as thermal capacitance, conductance, time constant, and IR responsivity is of the utmost importance as they directly influence microbolometer performance. Here we show a technique to measure the
Autor:
Pavel Neužil, Jaroslav Klempa, Vojtěch Svatoš, Martin Pumera, Imrich Gablech, Jan Pekárek, Ali Sajedi-Moghaddam
Publikováno v:
TrAC Trends in Analytical Chemistry. 105:251-262
Graphene has been of immense interest for its interesting electronic properties, such as being a zero-band gap semiconductor. However, to be able to usefully employ graphene for electronics and electronic-transduction system sensors and biosensors, o
Publikováno v:
Sensors and Actuators A: Physical. 271:217-222
Carbon nanotubes (CNTs) have attracted significant attention due to their remarkable mechanical and electrical properties. Although it is assumed that the most important questions about CNTs have been addressed, the opposite is true. CNTs have high m
Publikováno v:
Thin Solid Films. 638:57-62
We proposed a method to control and minimize residual stress in [001] preferentially oriented Ti thin films deposited by a Kaufman ion-beam source using a substrate temperature during deposition (T) as the parameter. We determined the residual stress
Autor:
And Pavel Neužil, Vojtěch Svatoš, Jaroslav Klempa, Imrich Gablech, Jan Pekárek, Petr Vyroubal
Publikováno v:
Proceedings. 2018, vol. 2, issue 13, p. 1-5.
Proceedings, Vol 2, Iss 13, p 1513 (2018)
Proceedings, Vol 2, Iss 13, p 1513 (2018)
This paper proposes a new method for characterization of 2D materials under the precisely specified conditions. It is achieved by integration of a 2D material as a field effect transistors structures with a piezoelectric resonator. Properties of the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9094a6c1eb028d5467b761b45e9e6105
https://hdl.handle.net/11012/137228
https://hdl.handle.net/11012/137228
Autor:
Tomáš Šikola, Imrich Gablech, Ondřej Caha, Jan Prasek, Jaromir Hubalek, Miloš Hrabovský, Vojtěch Svatoš
Publikováno v:
Journal of Materials Science. 2016, vol. 51, issue 7, p. 3329-3336.
We propose the ion-beam sputtering deposition providing Ti thin films of desired crystallographic orientation and smooth surface morphology not obtainable with conventional deposition techniques such as magnetron sputtering and vacuum evaporation. Th