Zobrazeno 1 - 10
of 63
pro vyhledávání: '"Vodakov, Yu.A."'
Autor:
Makarov, Yu.N., Avdeev, O.V., Barash, I.S., Bazarevskiy, D.S., Chemekova, T.Yu., Mokhov, E.N., Nagalyuk, S.S., Roenkov, A.D., Segal, A.S., Vodakov, Yu.A., Ramm, M.G., Davis, S., Huminic, G., Helava, H.
Publikováno v:
In Journal of Crystal Growth 2008 310(5):881-886
Autor:
Segal, A.S, Karpov, S.Yu, Makarov, Yu.N *, Mokhov, E.N, Roenkov, A.D, Ramm, M.G, Vodakov, Yu.A
Publikováno v:
In Journal of Crystal Growth 2000 211(1):68-72
Autor:
Karpov, S.Yu, Kulik, A.V, Zhmakin, I.A, Makarov, Yu.N, Mokhov, E.N, Ramm, M.G, Ramm, M.S *, Roenkov, A.D, Vodakov, Yu.A
Publikováno v:
In Journal of Crystal Growth 2000 211(1):347-351
Autor:
Segal, A.S, Vorob'ev, A.N, Karpov, S.Yu, Mokhov, E.N, Ramm, M.G, Ramm, M.S, Roenkov, A.D, Vodakov, Yu.A, Makarov, Yu.N *
Publikováno v:
In Journal of Crystal Growth 2000 208(1):431-441
Autor:
Ramm, M.S, Mokhov, E.N, Demina, S.E, Ramm, M.G, Roenkov, A.D, Vodakov, Yu.A, Segal, A.S, Vorob’ev, A.N, Karpov, S.Yu, Kulik, A.V, Makarov, Yu.N *
Publikováno v:
In Materials Science & Engineering B 1999 61:107-112
Autor:
Segal, A.S, Vorob’ev, A.N, Karpov, S.Yu, Makarov, Yu.N *, Mokhov, E.N, Ramm, M.G, Ramm, M.S, Roenkov, A.D, Vodakov, Yu.A, Zhmakin, A.I
Publikováno v:
In Materials Science & Engineering B 1999 61:40-43
Autor:
Muller, St.G., Hofmann, D., Mokhov, E.N., Ramm, M.G., Roenkov, A.D., Vodakov, Yu.A., Winnacker, A.
Publikováno v:
Proceedings of Semiconducting & Semi-Insulating Materials Conference; 1996, p219-222, 4p
Publikováno v:
Physica Status Solidi (B); Jul1997, Vol. 202 Issue 1, p177-200, 24p
Autor:
Matukov, I.D., Kalinin, D.S., Bogdanov, M.V., Karpov, S.Yu., Ofengeim, D.Kh., Ramm, M.S., Barash, J.S., Mokhov, E.N., Roenkov, A.D., Vodakov, Yu.A., Ramm, M.G., Helava, H., Makarov, Yuri N.
Publikováno v:
Materials Science Forum; June 2004, Vol. 457 Issue: 1 p63-66, 4p
Autor:
Mokhov, E.N., Roenkov, A.D., Vodakov, Yu.A., Karpov, S.Yu., Ramm, M.S., Segal, A.S., Makarov, Yu.A., Helava, H.
Publikováno v:
Materials Science Forum; September 2003, Vol. 433 Issue: 1 p979-982, 4p