Monopolelike probes for quantitative magnetic force microscopy: calibration and application

Autor: Vock, S., Wolny, F., Mühl, T., Kaltofen, R., Schultz, L., Büchner, B., Hassel, C., Lindner, L., Neu, V.

Publikováno v: S.Vock,F. Wolny, T. M\"uhl, R. Kaltofen, L. Schultz, B. B\"uchner, C. Hassel, L. Lindner, V. Neu, Appl. Phys. Lett. 97, 252505 (2010) (http://link.aip.org/link/?apl/97/252505)

A local magnetization measurement was performed with a Magnetic Force Microscope (MFM) to determine magnetization in domains of an exchange coupled [Co/Pt]/Co/Ru multilayer with predominant perpendicular anisotropy. The quantitative MFM measurements

Externí odkaz: http://arxiv.org/abs/1101.1804

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Magnetostatic nearest neighbor interactions in a Co48Fe52 nanowire array probed by in-field magnetic force microscopy.

Autor: Vock, S., Tschulik, K., Uhlemann, M., Hengst, C., Fäahler, S., Schultz, L., Neu, V.

Publikováno v: Journal of Applied Physics; 2015, Vol. 118 Issue 23, p233901-1-233901-6, 6p, 1 Black and White Photograph, 4 Graphs

Epitaxial hard magnetic SmCo5 MFM tips

Autor: Neu, V., Vock, S., Sturm, T., Schultz, L.

Cantilever based scanning force sensors, which probe a specific tip-sample interaction through a functional tip coating, are limited by the material performance achievable in the coating process. In case of the wide spread magnetic force microscopy (

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=od_______610::6fc16abc04c4b137f7c06e235b067d12
https://publica.fraunhofer.de/handle/publica/256775

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