Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Vladislav Dubikovsky"'
Autor:
Ani Khachatrian, Nicolas J.-H. Roche, Dale McMorrow, William T. Lotshaw, Vladislav Dubikovsky, Joel M. Hales, Stephen P. Buchner, Joseph W. Perry, Joseph S. Melinger, Jeffrey H. Warner
Publikováno v:
IEEE Transactions on Nuclear Science. 61:3504-3511
Nonlinear beam propagation software is used to calculate quantitatively the two-photon absorption (TPA)-induced charge-density profiles generated in silicon by focused femtosecond laser pulses under conditions that are experimentally relevant for sin
Autor:
Gabriele Susinno, Vladislav Dubikovsky
Publikováno v:
SSRN Electronic Journal.
Volatility is usually considered as a synonym for risk. Mainstream financial theory states that higher portfolio volatility is translated into higher expected returns while diversification helps eliminate idiosyncratic risks. This leaves us with an a
Autor:
Vladislav Dubikovsky, Gabriele Susinno
Publikováno v:
SSRN Electronic Journal.
Volatility is usually considered as a synonym for risk. Mainstream financial theory states that higher portfolio volatility is translated into higher expected returns while diversification helps eliminate idiosyncratic risks. This leaves us with an a
Autor:
Angelo Barbieri, Carl Gold, Alexei Gladkevich, Kelly H. Chang, John Fox, Lisa R. Goldberg, Vladislav Dubikovsky
Publikováno v:
SSRN Electronic Journal.
Factor models are standards in investment management. For decades, Barra factor models have provided valuable risk forecasts and inputs for the portfolio construction process. Most uses of factor models have targeted longer horizons of months or year
Publikováno v:
SSRN Electronic Journal.
Systematic model bias has been implicated in the global recession that began in 2007, and this bias can be traced back to assumptions about the normality of data. Nonetheless, the normal distribution continues to play a foundational role in quantitat
Publikováno v:
SSRN Electronic Journal.
Portfolio risk forecasts are commonly evaluated using test statistics that are sums of random variables. We study the distributional properties of these test statistics for value at risk, expected shortfall, and volatility. For a diverse collection o
Autor:
David J. Hagan, E. Miesak, Kevin D. Belfield, Vladislav Dubikovsky, Eric W. Stryland, Xiaobin Ren
Publikováno v:
Organic Thin Films for Photonic Applications.
Emerging device technologies such as rnicroelectromechanical systems and integrated sensors are placing increased demands on the development of materials processing and fabrication techniques.1,2
Autor:
Xiaobin Ren, David J. Hagan, Eric W. Van Stryland, Vladislav Dubikovsky, E. Miesak, Kevin D. Belfield
Publikováno v:
Journal of the American Chemical Society. 122:1217-1218