Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Vladimir Sinyakin"'
Autor:
Natalia Vetrova, Evgeny Kuimov, Vladimir Sinyakin, Sergey Meshkov, Mstislav Makeev, Vasiliy Shashurin
Publikováno v:
Sensors, Vol 23, Iss 18, p 7977 (2023)
This paper presents an effective compact model of current transfer for the estimation of hysteresis parameters on the volt-ampere characteristics of resonant-tunneling diodes. In the framework of the compact model, the appearance of hysteresis is exp
Externí odkaz:
https://doaj.org/article/798424bf804746988db4c925a210a031
Autor:
Natalia Vetrova, Evgeny Kuimov, Sergey Meshkov, Mstislav Makeev, Vladimir Sinyakin, Vasiliy Shashurin
Publikováno v:
Electronics
Volume 12
Issue 3
Pages: 519
Volume 12
Issue 3
Pages: 519
A compact analytical model of current transfer was developed to estimate the characteristics of heterostructured devices. The absence of empirical correction factors and the explicit accounting of the interelectronic interaction differentiates it fro
Publikováno v:
2018 International Russian Automation Conference (RusAutoCon).
The methodology of predicting radio frequency identification (RFID) passive tag power supply system reliability is developed. The reliability of a RFID passive tag power supply system is estimated in terms of a parametric failure associated with the
Autor:
S. V. Agasieva, Yu. A. Ivanov, S. A. Meshkov, Vladimir Sinyakin, V. I. Petrov, A. G. Gudkov, S. I. Schukin
Publikováno v:
Biomedical Engineering. 49:98-101
Application problems of radio-frequency identification technology with passive tags for invasive biosensor data readout are discussed. The choice of the working range of frequencies for the radio-frequency identification system is considered.
Publikováno v:
MATEC Web of Conferences, Vol 224, p 02095 (2018)
The technique for predicting RFID passive tag power supply system reliability, the failure of which is caused by the degradation of RTDs that are part of the tag rectifier, is developed. The calculation of the time to failure of the RFID passive tag
Publikováno v:
MATEC Web of Conferences, Vol 129, p 03019 (2017)
The problems of technical diagnostics of electronic nanoobjects and devices based on them are considered. Algorithms for constructing the operability and reliability prediction fields of electronic nanoobjects and devices based on them in the specifi