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Autor:
N. A. Usachev, Vitally A. Telets, G. V. Chukov, V. V. Elesin, A. G. Kuznetsov, D. I. Sotskov, G. N. Nazarova, Dmitry V. Boychenko
Publikováno v:
2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
This paper presents a brief overview of total ionizing dose effects for a variety of PLL ICs and PLL-based frequency synthesizer implemented in commercial bulk CMOS, silicon-on-insulator CMOS, BiCMOS and SiGe BiCMOS technology processes with frequenc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::efc974f3ff7a0a760d4a161d59337bdf
https://doi.org/10.1109/radecs.2015.7365690
https://doi.org/10.1109/radecs.2015.7365690
