Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Vitaliy Balazyuk"'
Autor:
Mykola Raransky, M. M. Gunko, A. Ya. Struk, Gas, Karpatska Str., Ivano-Frankivsk, Ukraine, Vitaliy Balazyuk, V. B. Gevyk
Publikováno v:
METALLOFIZIKA I NOVEISHIE TEKHNOLOGII. 39:245-263
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::583df001750ddb144179b595c08d5619
https://doi.org/10.15407/mfint.39.02.0245
https://doi.org/10.15407/mfint.39.02.0245
Autor:
Viktor Strebezhev, Vitaliy Balazyuk, Yuriy Khalavka, George Vorobets, Olexandr Vorobets, V.V. Strebezhev
Publikováno v:
2015 IEEE 35th International Conference on Electronics and Nanotechnology (ELNANO).
Photosensitive elements of semiconductor compounds In 4 Se 3 , In 4 Te 3 , CdSb and heterostructures were obtained by liquid phase epitaxy method. Laser modification of structural and phase state of epitaxial layers was conducted. The methods of SEM,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::599a7e8fc41ee6e8cfefcae2347d3865
https://doi.org/10.1109/elnano.2015.7146878
https://doi.org/10.1109/elnano.2015.7146878
Publikováno v:
Eleventh International Conference on Correlation Optics.
X-ray diffraction moire methods in the geometry of L-L-L Laue diffraction have been used to determine crystal structure defects arising in the near-surface Si layers on mechanical treatment (cutting with diamond disc and grinding). A model of damaged
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6758c9416cf6d8cb5e0ddff6549cb548
https://doi.org/10.1117/12.2053248
https://doi.org/10.1117/12.2053248
Autor:
Maria Kshevetska, Vitaliy Balazyuk, Mykola Raransky, Mykola Melnyk, Olga Kniginitska, Mykhailo Gunko
Publikováno v:
Eleventh International Conference on Correlation Optics.
Analysis of multiple-wave diffraction in multi-unit X-ray interferometers is made. Geometry of multiple-wave diffractions and X-ray reflection factors Rm (t) are analyzed. Experimental moire patterns for the case of LLLinterferometer at (000, 220, 02
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::708faad67b434d5c03d46de9498b499b
https://doi.org/10.1117/12.2053240
https://doi.org/10.1117/12.2053240
Publikováno v:
SPIE Proceedings.
This work studies displacement and deformation fields in Si arising at radiation with neodymium laser beam of energy ~1 J and pulse duration 10 -3 s. Investigations were performed using moire fringe method with employment of X-ray interferometer base
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bb68a3f4755bdf6994c495d54a9f8024
https://doi.org/10.1117/12.917092
https://doi.org/10.1117/12.917092