Zobrazeno 1 - 10
of 10
pro vyhledávání: '"Vitali Sokhin"'
Autor:
Natalia Freidman, Shay Aviv, Cockcroft Bryant, Tom Kolan, Elena Tsanko, Hernan Theiler, Hagai Hadad, John M. Ludden, Shai Doron, Hillel Mendelson, Vitali Sokhin
Publikováno v:
DATE
I. Abstract Post silicon validation is a unique challenge in the design verification process. On one hand, it utilizes real silicon and is therefore able to cover a larger state-space. On the other, it suffers from debugging challenges due to a lack
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c167dabdd751c4bc001958d7b09d1ca6
https://doi.org/10.23919/date51398.2021.9474095
https://doi.org/10.23919/date51398.2021.9474095
Publikováno v:
DATE
Due to the complexity of designs, post-silicon validation remains a major challenge with few systematic solutions. We provide an overview of the state-of-the-art post silicon validation process used by IBM to verify its latest IBM POWER9 processor. D
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d9c9614140bc8cb9955df6bf98d0ab0b
https://doi.org/10.23919/date48585.2020.9116491
https://doi.org/10.23919/date48585.2020.9116491
Autor:
Jae Cheol Son, Jin Sung Park, Wookyeong Jeong, Arkadiy Morgenshtein, Wisam Kadry, Amir Nahir, Vitali Sokhin, Dimtry Krestyashyn, Sung-Boem Park
Publikováno v:
IEEE Design & Test. 34:65-76
Hardware-accelerated simulation platforms can significantly reduce the validation time. This article presents an off-platform test generation method and it compares and contrasts it against the on-platform alternative for two state-of-the-art multico
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::dbac9dc1003a3c6a3c4e039fb90b9345
https://doi.org/10.1109/mdat.2016.2527998
https://doi.org/10.1109/mdat.2016.2527998
Publikováno v:
Post-Silicon Validation and Debug ISBN: 9783319981154
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a6822698235ce5c4c72b84691a2a1d9b
https://doi.org/10.1007/978-3-319-98116-1_17
https://doi.org/10.1007/978-3-319-98116-1_17
Unveiling difficult bugs in address translation caching arrays for effective post-silicon validation
Autor:
Vitali Sokhin, George N. Papadimitriou, Anatoly Koyfman, Athanasios Chatzidimitriou, Ronny Morad, Dimitris Gizopoulos, Tom Kolan
Publikováno v:
ICCD
Post-silicon validation is one of the most important parts of the microprocessor prototype chip lifecycle. It is the last chance for debug engineers to detect defects and bugs that escaped pre-silicon verification, before the chip is released to the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0acaaec8770aebaefd599845021448b2
https://doi.org/10.1109/iccd.2016.7753339
https://doi.org/10.1109/iccd.2016.7753339
Autor:
Ronny Morad, Valeria Bertacco, Vitali Sokhin, Doowon Lee, Arkadiy Morgenshtein, Avi Ziv, Tom Kolan
Publikováno v:
DAC
Post-silicon validation has become essential in catching hard-to-detect, rarely-occurring bugs that have slipped through pre-silicon verification. Post-silicon validation flows, however, are challenged by limited signal observability, which impacts t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c06f0da0738a06b4783e99b9e320a52a
https://doi.org/10.1145/2897937.2898072
https://doi.org/10.1145/2897937.2898072
Autor:
Wisam Kadry, Dimtry Krestyashyn, Arkadiy Morgenshtein, Amir Nahir, Vitali Sokhin, Jin Sung Park, Sung-Boem Park, Wookyeong Jeong, Jae Cheol Son
Publikováno v:
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::25730653b818e984d78df791b1e8ed6e
https://doi.org/10.7873/date.2015.0605
https://doi.org/10.7873/date.2015.0605
Publikováno v:
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4ec0d1dbe5eaa6ca398d80ab8fdf3843
https://doi.org/10.7873/date.2014.332
https://doi.org/10.7873/date.2014.332
Publikováno v:
Hardware and Software: Verification and Testing ISBN: 9783319030760
Haifa Verification Conference
Haifa Verification Conference
Post-silicon functional validation poses unique challenges that must be overcome by bring-up tools. One such major challenge is the requirement to reduce overhead associated with the testing procedures, thereby ensuring that the expensive silicon pla
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::11f880208a30afc00f22fe6ecb0f4b1d
https://doi.org/10.1007/978-3-319-03077-7_12
https://doi.org/10.1007/978-3-319-03077-7_12
Publikováno v:
DAC
Post-silicon validation poses unique challenges that bring-up tools must face, such as the lack of observability into the design, the typical instability of silicon bring-up platforms and the absence of supporting software (like an OS or debuggers).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2f9cd904d533fd168434e929536db1f5
https://doi.org/10.1145/2024724.2024916
https://doi.org/10.1145/2024724.2024916