Zobrazeno 1 - 10
of 31
pro vyhledávání: '"Virpi Korpelainen"'
Autor:
Jérôme Deumer, Robin Schürmann, Anikó Gaál, Zoltán Varga, Britta Bettin, Edwin van der Pol, Rienk Nieuwland, David Ojeda, Aneta Sikora, Dorota Bartczak, Heidi Goenaga-Infante, Johanna Noireaux, Mahrad Khakpour, Virpi Korpelainen, Christian Gollwitzer
Publikováno v:
Discover Nano, Vol 19, Iss 1, Pp 1-17 (2024)
Abstract The concentration of cell-type specific extracellular vesicles (EVs) is a promising biomarker for various diseases. However, concentrations of EVs measured by optical techniques such as flow cytometry (FCM) or particle tracking analysis (PTA
Externí odkaz:
https://doaj.org/article/11c1267a59a644cab614bb570c6ae2a3
Autor:
Aleksandr Aleksandrovich Danilenko, Masoud Rastgou, Farshid Manoocheri, Jussi Kinnunen, Virpi Korpelainen, Antti Lassila, Erkki Ikonen
Publikováno v:
Danilenko, A, Rastgou, M, Manoocheri, F, Kinnunen, J, Korpelainen, V, Lassila, A & Ikonen, E 2023, ' Characterization of PillarHall test chip structures using a reflectometry technique ', Measurement Science and Technology, vol. 34, no. 9, 094006 . https://doi.org/10.1088/1361-6501/acda54
Thin film samples where one of the thin layers consists of vacuum or air are called PillarHalls due to their support structure in silicon wafers. Custom PillarHall samples were provided by manufacturer and characterized by reflectometry with spectrom
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ee569c1a20907cd1503c98102833e275
https://cris.vtt.fi/en/publications/31675d25-26e3-42c8-90bc-185a4ce6f009
https://cris.vtt.fi/en/publications/31675d25-26e3-42c8-90bc-185a4ce6f009
Autor:
Mikko Utriainen, Riikka L. Puurunen, Oili Ylivaara, Markku Ylilammi, Virpi Korpelainen, Eero Haimi, Emma Verkama, Jihong Yim
Publikováno v:
Yim, J, Ylivaara, O M E, Ylilammi, M, Korpelainen, V, Haimi, E, Verkama, E, Utriainen, M & Puurunen, R L 2020, ' Saturation profile based conformality analysis for atomic layer deposition : Aluminum oxide in lateral high-aspect-ratio channels ', Physical Chemistry Chemical Physics, vol. 22, no. 40, pp. 23107-23120 . https://doi.org/10.26434/chemrxiv.12366623.v4, https://doi.org/10.1039/d0cp03358h
Atomic layer deposition (ALD) raises global interest through its unparalleled conformality. This work describes new microscopic lateral high-aspect-ratio (LHAR) test structures for conformality analysis of ALD. The LHAR structures are made of silicon
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::27c90ead4a2761be5e82527e1771bdfb
https://doi.org/10.26434/chemrxiv.12366623
https://doi.org/10.26434/chemrxiv.12366623
Autor:
Jihong Yim, Oili Ylivaara, Markku Ylilammi, Virpi Korpelainen, Eero Haimi, Emma Verkama, Mikko Utriainen, Riikka, L. Puurunen
Publikováno v:
Yim, J, Ylivaara, O M E, Ylilammi, M, Korpelainen, V, Haimi, E, Verkama, E, Utriainen, M & Puurunen, R L 2020, ' Conformality in Aluminum Oxide ALD Process Analyzed using 3rd Generation Silicon Based Lateral High Aspect Ratio Test Structures ', AVS 20th International Conference on Atomic Layer Deposition featuring the 7th International Atomic Layer Etching Workshop, 29/06/20-1/07/20 .
VTT Technical Research Centre of Finland-PURE
VTT Technical Research Centre of Finland-PURE
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::cc844453b986300e0fe18e00c2d614a3
https://cris.vtt.fi/en/publications/20b70393-4fbd-4e1e-b88c-8fcdcc398325
https://cris.vtt.fi/en/publications/20b70393-4fbd-4e1e-b88c-8fcdcc398325
Autor:
Virpi Korpelainen, Andrew L. Rohl, Kai Nordlund, Hannu Husu, Jeremias Seppä, Martti Heinonen, Antti Lassila, Bernhard Reischl, Paolo Raiteri, Hannu Sairanen
Publikováno v:
Seppä, J, Reischl, B, Sairanen, H, Korpelainen, V, Husu, H, Heinonen, M, Raiteri, P, Rohl, A L, Nordlund, K & Lassila, A 2017, ' Atomic force microscope adhesion measurements and atomistic molecular dynamics simulations at different humidities ', Measurement Science and Technology, vol. 28, no. 3, 034004 . https://doi.org/10.1088/1361-6501/28/3/034004
Due to their operation principle atomic force microscopes (AFMs) are sensitive to all factors affecting the detected force between the probe and the sample. Relative humidity is an important and often neglected-both in experiments and simulations-fac
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::07ac52d7f234f54948db4aef8da6c02f
http://hdl.handle.net/10138/308770
http://hdl.handle.net/10138/308770
Autor:
Virpi Korpelainen, Feng Gao, Mari Laamanen, Oili Ylivaara, Jonas Sundqvist, Mikko Utriainen, Puurunen, Riikka L.
Publikováno v:
Korpelainen, V, Gao, F, Laamanen, M, Ylivaara, O M E, Sundqvist, J, Utriainen, M & Puurunen, R L 2017, ' Traceability of internal length scale in PillarHall thin film conformality test chips ', 5th Dresden Nanoanalysis Symposium "In-situ Microscopy", Dresden, Germany, 1/09/17 . < https://www.nanoanalytik.fraunhofer.de/content/dam/nanoanalytik/de/documents/5th_Dresden_Nanoanalysis_Symposium_abstracts.pdf >
VTT Technical Research Centre of Finland-PURE
VTT Technical Research Centre of Finland-PURE
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::3a8402821f9938def5224383198f6b96
https://cris.vtt.fi/en/publications/597c4e57-79b2-4b36-979e-24d4a7b20202
https://cris.vtt.fi/en/publications/597c4e57-79b2-4b36-979e-24d4a7b20202
Publikováno v:
Korpelainen, V, Seppä, J & Lassila, A 2010, ' Design and characterization of MIKES metrological atomic force microscope ', Precision Engineering, vol. 34, no. 4, pp. 735-744 . https://doi.org/10.1016/j.precisioneng.2010.04.002
An interferometrically traceable metrological atomic force microscope (IT-MAFM) has been developed at MIKES. It can be used for traceable atomic force microscope (AFM) measurements and for calibration of transfer standards of scanning probe microscop
Autor:
Antti Lassila, Virpi Korpelainen
Publikováno v:
Korpelainen, V & Lassila, A 2007, ' Calibration of a commercial AFM: traceability for a coordinate system ', Measurement Science and Technology, vol. 18, no. 2, pp. 395-403 . https://doi.org/10.1088/0957-0233/18/2/S11
Traceability of measurements and calibration of devices are needed also at the nanometre scale. Calibration of a commercial atomic force microscope (AFM) was studied as part of a dimensional nanometrology project at MIKES. The calibration procedure a
Autor:
Virpi Korpelainen
Publikováno v:
VTT Technical Research Centre of Finland-PURE
Reliability of measurement is a crucial element of both research and industry. Metrological traceability to the SI unit metre guarantees commensurate units, also at nanometre range. In this thesis, a traceability chain is established for nanometre sc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::3f8d4d2bf8ac2c474e43230a41e461cd
http://hdl.handle.net/10138/136472
http://hdl.handle.net/10138/136472
Autor:
Jeremias Seppä, Antti Lassila, Lauri Lillepea, Helge Karlsson, Sten Bergstrand, Virpi Korpelainen
Publikováno v:
Seppä, J, Korpelainen, V, Bergstrand, S, Karlsson, H, Lillepea, L & Lassila, A 2014, ' Intercomparison of lateral scales of scanning electron microscopes and atomic force microscopes in research institutes in Northern Europe ', Measurement Science and Technology, vol. 25, no. 4, 044013 . https://doi.org/10.1088/0957-0233/25/4/044013
An intercomparison of lateral scales of scanning electron microscopes (SEM) and atomic force microscopes (AFM) in various research laboratories in Northern Europe was organized by the local national metrology institutes. In this paper are presented t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b586c15cd3715808d6f9c680b2525234
https://cris.vtt.fi/en/publications/7cc31677-6265-434d-ab42-a00c86258f44
https://cris.vtt.fi/en/publications/7cc31677-6265-434d-ab42-a00c86258f44