Zobrazeno 1 - 10
of 179
pro vyhledávání: '"Virazel, Arnaud"'
Publikováno v:
ETS 2023-28th IEEE European Test Symposium
ETS 2023-28th IEEE European Test Symposium, May 2023, Venise, Italy. ⟨10.1109/ETS56758.2023.10174107⟩
ETS 2023-28th IEEE European Test Symposium, May 2023, Venise, Italy. ⟨10.1109/ETS56758.2023.10174107⟩
International audience; The adoption of In-Memory Computing (IMC) architectures is one of the promising approaches to efficiently solve the Von Neumann bottleneck problem. In addition to arithmetic operations, IMC architectures aim at integrating add
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______3515::3a87c6eb4e6424ef5c85c502c2781db8
https://hal.science/hal-04164663/document
https://hal.science/hal-04164663/document
Publikováno v:
Microelectronics Reliability
Microelectronics Reliability, 2023, 147, pp.115029. ⟨10.1016/j.microrel.2023.115029⟩
Microelectronics Reliability, 2023, 147, pp.115029. ⟨10.1016/j.microrel.2023.115029⟩
International audience; A promising new alternative to efficiently solve the Von Neumann bottleneck problem is to adopt In-Memory Computing (IMC) architectures. Beyond the arithmetic operations, IMC architectures aim at integrating additional logic o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______3515::a42ad07bb2112ff96cb143e1eda5fc04
https://hal.science/hal-04129470/file/Revue_Microelectronics&Reliability.pdf
https://hal.science/hal-04129470/file/Revue_Microelectronics&Reliability.pdf
Autor:
Xhafa, Xhesila, Ladhar, Aymen, Faehn, Eric, Anghel, Lorena, Di Pendina, Gregory, Girard, Patrick, Virazel, Arnaud
Publikováno v:
16e Colloque National du GDR SoC²
16e Colloque National du GDR SoC², Jun 2022, Strasbourg, France
16e Colloque National du GDR SoC², Jun 2022, Strasbourg, France
National audience; This paper presents a novel approach to memory testing which relies on Cell-Aware (CA) test to further improve the yield in SoCs. Therefore, using CA test shifts the memory testing methodology from functional to structural testing.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______3515::30a67368e0ebf55858f40a3e63ecfcd1
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03987914/document
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03987914/document
Publikováno v:
16e Colloque National du GDR SoC²
16e Colloque National du GDR SoC², Jun 2022, Strasbourg, France
16e Colloque National du GDR SoC², Jun 2022, Strasbourg, France
National audience; A promising new alternative to efficiently solve the von Neumann bottleneck problem is to adopt In-Memory Computing (IMC) architectures. Beyond the arithmetic operations, IMC architectures aim at integrating additional logic operat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______3515::3051ced6d1f6f346f03935eb13185658
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03990078
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03990078
Autor:
Cantoro, Riccardo, Garau, Francesco, Girard, Patrick, Kolahimahmoudi, Nima, Sartoni, Sandro, Reorda, Matteo Sonza, Virazel, Arnaud
Publikováno v:
UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
Universitat Politècnica de Catalunya (UPC)
In-field test of integrated circuits using Self-Test Libraries (STLs) is a widely used technique specifically suited to guarantee the processor’s correct behavior during the operative lifetime, as mandated by functional safety standards such as ISO
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::c74bbe9c6ae2211e3201fbc7b9994f30
https://hdl.handle.net/2117/372132
https://hdl.handle.net/2117/372132
Publikováno v:
Approximate Computing ISBN: 9783030983468
Approximate Computing
Approximate Computing, Springer International Publishing, pp.233-266, 2022, ⟨10.1007/978-3-030-98347-5_10⟩
Approximate Computing
Approximate Computing, Springer International Publishing, pp.233-266, 2022, ⟨10.1007/978-3-030-98347-5_10⟩
International audience; The undeniable need of energy efficiency in today’s devices is leading to the adoption of innovative computing paradigms—such as Approximate Computing. As this paradigm is gaining increasing interest, important challenges,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::db0a145781263610d3505ac0d5e0bb4a
https://doi.org/10.1007/978-3-030-98347-5_10
https://doi.org/10.1007/978-3-030-98347-5_10
Autor:
Aziza, Hassen, Hamdioui, Said, Fieback, Moritz, Taouil, Mottaqiallah, Moreau, Mathieu, Girard, Patrick, Virazel, Arnaud, Coulié, Karine
Publikováno v:
Microelectronics Reliability
Microelectronics Reliability, 2021, 126, pp.1877-1880. ⟨10.23919/DATE51398.2021.9473967⟩
DATE
Microelectronics Reliability, Elsevier, 2021, 126, pp.1877-1880. ⟨10.23919/DATE51398.2021.9473967⟩
Microelectronics Reliability, 2021, 126, pp.1877-1880. ⟨10.23919/DATE51398.2021.9473967⟩
DATE
Microelectronics Reliability, Elsevier, 2021, 126, pp.1877-1880. ⟨10.23919/DATE51398.2021.9473967⟩
International audience; Multi-Level Cell (MLC) technology can greatly reduce Resistive RAM (RRAM) die sizes to achieve a breakthrough in cost structure. In this paper, a novel design scheme is proposed to realize reliable and uniform MLC RRAM operati
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::499395912847c0a4731151c3e3be19fb
https://hal.science/hal-03504284/file/electronics-10-02222-v2.pdf
https://hal.science/hal-03504284/file/electronics-10-02222-v2.pdf
Autor:
Aziza, Hassan, Hamdioui, Said, Fieback, Moritz, Taouil, Mottaqiallah, Moreau, Mathieu, Girard, Patrick, Virazel, Arnaud, Coulié, K.
Publikováno v:
Electronics
Electronics, MDPI, 2021, 10 (18), pp.#2222. ⟨10.3390/electronics10182222⟩
Volume 10
Issue 18
Electronics (Switzerland), 10(18)
Electronics, MDPI, 2021, 10 (18), pp.2222. ⟨10.3390/electronics10182222⟩
Electronics, Vol 10, Iss 2222, p 2222 (2021)
Electronics, 2021, 10 (18), pp.#2222. ⟨10.3390/electronics10182222⟩
Electronics, MDPI, 2021, 10 (18), pp.#2222. ⟨10.3390/electronics10182222⟩
Volume 10
Issue 18
Electronics (Switzerland), 10(18)
Electronics, MDPI, 2021, 10 (18), pp.2222. ⟨10.3390/electronics10182222⟩
Electronics, Vol 10, Iss 2222, p 2222 (2021)
Electronics, 2021, 10 (18), pp.#2222. ⟨10.3390/electronics10182222⟩
International audience; RRAM density enhancement is essential not only to gain market share in the highly competitive emerging memory sector but also to enable future high-capacity and power-efficient brain-inspired systems, beyond the capabilities o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::7dee8f37ca6eee34b96ea4829e7f76ad
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03377249/document
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03377249/document
Autor:
Lapeyre, Sébastien, Valette, Nicolas, Merandat, Marc, Flottes, Marie-Lise, Rouzeyre, Bruno, Virazel, Arnaud
Publikováno v:
15ème Colloque National du GDR SoC²
15ème Colloque National du GDR SoC², Jun 2021, Rennes, France
15ème Colloque National du GDR SoC², Jun 2021, Rennes, France
National audience; Lors du design d'un circuit intégré, il est nécessaire d'implémenter des fonctionnalités complémentaires de tests et sécuritaires pour assurer la qualité, la fiabilité et la sécurité. Nos travaux ont pour optique d'être
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::a3f5573eb87bda074c92654f9c08aa23
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03361957
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03361957
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