Zobrazeno 1 - 10
of 1 270
pro vyhledávání: '"Virazel, A."'
Publikováno v:
In Microelectronics Reliability August 2023 147
Publikováno v:
In Microelectronics Reliability August 2022 135
Publikováno v:
ETS 2023-28th IEEE European Test Symposium
ETS 2023-28th IEEE European Test Symposium, May 2023, Venise, Italy. ⟨10.1109/ETS56758.2023.10174107⟩
ETS 2023-28th IEEE European Test Symposium, May 2023, Venise, Italy. ⟨10.1109/ETS56758.2023.10174107⟩
International audience; The adoption of In-Memory Computing (IMC) architectures is one of the promising approaches to efficiently solve the Von Neumann bottleneck problem. In addition to arithmetic operations, IMC architectures aim at integrating add
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______3515::3a87c6eb4e6424ef5c85c502c2781db8
https://hal.science/hal-04164663/document
https://hal.science/hal-04164663/document
Publikováno v:
2023 IEEE European Test Symposium (ETS)
2023 IEEE European Test Symposium (ETS), May 2023, Venezia, Italy. pp.1-4, ⟨10.1109/ETS56758.2023.10174118⟩
2023 IEEE European Test Symposium (ETS), May 2023, Venezia, Italy. pp.1-4, ⟨10.1109/ETS56758.2023.10174118⟩
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______3515::f48cf55aba8334cfd3b31908063eb07c
https://hal.science/hal-04164704
https://hal.science/hal-04164704
Publikováno v:
Frontiers of Quality Electronic Design (QED) ISBN: 9783031163432
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7398ffe8261634e2d7eb6271818ac0fc
https://doi.org/10.1007/978-3-031-16344-9_6
https://doi.org/10.1007/978-3-031-16344-9_6
Publikováno v:
Frontiers of Quality Electronic Design (QED) ISBN: 9783031163432
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::93c7696d9d578834eb82d4440215e67c
https://doi.org/10.1007/978-3-031-16344-9_17
https://doi.org/10.1007/978-3-031-16344-9_17
Autor:
Aymen Ladhar, Arnaud Virazel
Publikováno v:
Machine Learning Support for Fault Diagnosis of System-on-Chip ISBN: 9783031196386
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b9fdf07938c7805d5a8fcfcf1f8fd046
https://doi.org/10.1007/978-3-031-19639-3_6
https://doi.org/10.1007/978-3-031-19639-3_6
Autor:
Xhafa, Xhesila, Ladhar, Aymen, Faehn, Eric, Anghel, Lorena, Di Pendina, Gregory, Girard, Patrick, Virazel, Arnaud
Publikováno v:
16e Colloque National du GDR SoC²
16e Colloque National du GDR SoC², Jun 2022, Strasbourg, France
16e Colloque National du GDR SoC², Jun 2022, Strasbourg, France
National audience; This paper presents a novel approach to memory testing which relies on Cell-Aware (CA) test to further improve the yield in SoCs. Therefore, using CA test shifts the memory testing methodology from functional to structural testing.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______3515::30a67368e0ebf55858f40a3e63ecfcd1
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03987914/document
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03987914/document
Publikováno v:
16e Colloque National du GDR SoC²
16e Colloque National du GDR SoC², Jun 2022, Strasbourg, France
16e Colloque National du GDR SoC², Jun 2022, Strasbourg, France
National audience; A promising new alternative to efficiently solve the von Neumann bottleneck problem is to adopt In-Memory Computing (IMC) architectures. Beyond the arithmetic operations, IMC architectures aim at integrating additional logic operat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______3515::3051ced6d1f6f346f03935eb13185658
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03990078
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03990078