Výsledky vyhledávání - "Vinh Van Ngo"

STEM Imaging of Lattice Fringes and beyond in a UHR In-Lens Field-Emission SEM

Autor: David C. Joy, Mike Hernandez, Vinh Van Ngo, Bill Roth

Publikováno v: Microscopy Today. 15:12-17

The phase-contrast imaging of atomic lattices has now become commonplace for both Transmission Electron Microscopes (TEM) and Scanning Transmission Electron Microscopes (STEMs). Recently, however, bright-field STEM images of multi-wall carbon nanotub

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::17ca14656d5ead4f23dd3375984f2429
https://doi.org/10.1017/s1551929500050951

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Combined Electron Beam Induced Current Imaging (EBIC) and Focused Ion Beam (FIB) Techniques for Thin Film Solar Cell Characterization

Autor: Vinh Van Ngo, Frank Altmann, Ralf Lehmann, Stacey Stone, Jan Schischka, Laurens F. Tz. Kwakman

Publikováno v: International Symposium for Testing and Failure Analysis.

A novel analytical method applying combined electron beam induced current (EBIC) imaging based on scanning electron microscopy (SEM) and focused ion beam (FIB) cross sectioning in a SEM/FIB dualbeam system is presented. The method is demonstrated in

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::c98c889b13c586bd299384b1907d7dba
https://doi.org/10.31399/asm.cp.istfa2010p0151

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