Proliferation of Faulty Materials Data Analysis in the Literature

Autor: William Skinner, Sven Tougaard, Christopher D. Easton, Thomas R. Gengenbach, Jeff Terry, Matthew R. Linford, Cedric J. Powell, Kateryna Artyushkova, Mark C. Biesinger, Mark H. Engelhard, Andreas Thissen, Peter M. A. Sherwood, Paul Dietrich, George H. Major, Karen J. Gaskell, Alberto Herrera-Gomez, C. Richard Brundle, John T. Grant, Jean-Jacques Pireaux, Christopher F McConville, Vincent S. Smentkowski, Donald R. Baer

Publikováno v: Linford, M R, Smentkowski, V S, Grant, J T, Brundle, C R, Sherwood, P M A, Biesinger, M C, Terry, J, Artyushkova, K, Herrera-Gómez, A, Tougaard, S, Skinner, W, Pireaux, J J, McConville, C F, Easton, C D, Gengenbach, T R, Major, G H, Dietrich, P, Thissen, A, Engelhard, M, Powell, C J, Gaskell, K J & Baer, D R 2019, ' Proliferation of Faulty Materials Data Analysis in the Literature ', Microscopy and Microanalysis, vol. 26, no. 1, pp. 1-2 . https://doi.org/10.1017/s1431927619015332
Linford, M R, Smentkowski, V S, Grant, J T, Brundle, C R, Sherwood, P M A, Biesinger, M C, Terry, J, Artyushkova, K, Herrera-Gómez, A, Tougaard, S, Skinner, W, Pireaux, J J, McConville, C F, Easton, C D, Gengenbach, T R, Major, G H, Dietrich, P, Thissen, A, Engelhard, M, Powell, C J, Gaskell, K J & Baer, D R 2020, ' Proliferation of Faulty Materials Data Analysis in the Literature ', Microscopy and Microanalysis, vol. 26, no. 1, pp. 1-2 . https://doi.org/10.1017/S1431927619015332

As a group of subject-matter experts in X-ray photoelectron spectroscopy (XPS) and other material characterization techniques from different countries and institutions, we write this document to raise awareness of an epidemic of poor and incorrect ma

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8daa34111813397a5f5b2ed1200de8ee
https://pubmed.ncbi.nlm.nih.gov/31948499

Quantitative depth profiling of Al in SiC using time of flight–secondary ion mass spectroscopy

Autor: Shubhodeep Goswami, Vincent S. Smentkowski

Publikováno v: Journal of Vacuum Science & Technology A. 39:033204

Historically, dynamic secondary ion mass spectroscopy (D-SIMS) has been used to quantitatively monitor the depth distribution of species present in low concentrations in samples/devices. We are not aware of any manuscript that describes the use of ti

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::705ebb72d7cdaebcc16ff402548ebb6c
https://doi.org/10.1116/6.0000905

Using ToF-SIMS to study industrial surface phenomena

Autor: Michael R. Keenan, Vincent S. Smentkowski, Henrik Arlinghaus

Publikováno v: Surface Science. 652:39-45

Time of flight secondary ion mass spectrometry (ToF-SIMS) is frequently used to analyze industrial samples since it offers high (ppb) detection sensitivity, very high surface specificity (analysis of the top 1–3 surface layers during a spectral/ima

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::28c7367d295fff19ef2ef892540ce165
https://doi.org/10.1016/j.susc.2016.02.017

The statistics of ToF-SIMS data revisited and introduction of the empirical Poisson correction

Autor: Michael R. Keenan, Vincent S. Smentkowski

Publikováno v: Surface and Interface Analysis. 48:218-225

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::c7228b78e55499ddba2250870108db81
https://doi.org/10.1002/sia.5955

Atomic-Scale Phase Composition through Multivariate Statistical Analysis of Atom Probe Tomography Data

Autor: Robert M. Ulfig, E Oltman, Thomas F. Kelly, Michael R. Keenan, David J. Larson, Vincent S. Smentkowski

Publikováno v: Microscopy and Microanalysis. 17:418-430

We demonstrate for the first time that multivariate statistical analysis techniques can be applied to atom probe tomography data to estimate the chemical composition of a sample at the full spatial resolution of the atom probe in three dimensions. Wh

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::79b36409d46ca9ee031d0b65108bed65
https://doi.org/10.1017/s1431927611000353