Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Vincent Reynaud"'
Publikováno v:
ITC
2021 IEEE International Test Conference (ITC)
IEEE International Test Conference (ITC 2021)
IEEE International Test Conference (ITC 2021), Oct 2021, Anaheim (CA), United States. pp.344-353, ⟨10.1109/ITC50571.2021.00050⟩
IEEELink
2021 IEEE International Test Conference (ITC)
IEEE International Test Conference (ITC 2021)
IEEE International Test Conference (ITC 2021), Oct 2021, Anaheim (CA), United States. pp.344-353, ⟨10.1109/ITC50571.2021.00050⟩
IEEELink
International audience; In recent years, the world of VLSI testing has been living a huge transformation pushed by constraints and requirements coming from a large variety of sources and applications. The traditional need for higher accessibility and
Publikováno v:
19th IEEE International New Circuits and Systems Conference (NEWCAS 2021)
19th IEEE International New Circuits and Systems Conference (NEWCAS 2021), Jun 2021, Toulon, France
NEWCAS
19th IEEE International New Circuits and Systems Conference (NEWCAS 2021), Jun 2021, Toulon, France
NEWCAS
International audience; The testability of electronic devices is of critical importance and it is often supported by IEEE standards. The presence of test structures, on the other hand, paves the way for malicious attackers to access the circuit and e
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::63b4f0bf2b477f8461205034ad4ed998
https://hal.science/hal-03287523/document
https://hal.science/hal-03287523/document
Autor:
Michele Portolan, Ghislain Takam Tchendjou, Vincent Reynaud, Salvador Mir, Paolo Maistri, Emmanuel Simeu, Manuel J. Barragan, Regis Leveugle, Kalpana Senthamarai Kannan, Lorena Anghel, Renato S. Feitoza
Publikováno v:
2020 IEEE 26th International Symposium on
Testing and Robust System Design (IOLTS)
2020 International Symposium on
Testing and Robust System Design (IOLTS 2020)
Testing and Robust System Design (IOLTS 2020), Jul 2020, Naples (Virtual Conference), Italy. ⟨10.1109/IOLTS50870.2020.9159721⟩
IOLTS
Testing and Robust System Design (IOLTS)
2020 International Symposium on
Testing and Robust System Design (IOLTS 2020)
Testing and Robust System Design (IOLTS 2020), Jul 2020, Naples (Virtual Conference), Italy. ⟨10.1109/IOLTS50870.2020.9159721⟩
IOLTS
International audience; The disruptive potential of the IEEE 1687 standard does not come from a single innovation, but rather from its capacity of providing a unified framework where heterogeneous approaches can co-exist and interact. In this Special
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::97342840e56e08021b9edfc5631de8e2
https://hal.science/hal-02939302/document
https://hal.science/hal-02939302/document
Autor:
Emanuele Valea, Bruno Rouzeyre, Nicolas Valette, Regis Leveugle, Vincent Reynaud, Marc Merandat, Marie-Lise Flottes, Jerome Quevremont, Paolo Maistri, Sophie Dupuis, Giorgio Di Natale
Publikováno v:
4th International Verification and Security Workshop (IVSW 2019)
4th International Verification and Security Workshop (IVSW 2019), Jul 2019, Rhodes, Greece. pp.43-48, ⟨10.1109/IVSW.2019.8854428⟩
IVSW
IVSW 2019-4th IEEE International Verification and Security Workshop
IVSW 2019-4th IEEE International Verification and Security Workshop, Jul 2019, Rhodes, Greece. pp.43-48, ⟨10.1109/IVSW.2019.8854428⟩
4th International Verification and Security Workshop
IVSW: International Verification and Security Workshop
IVSW: International Verification and Security Workshop, Jul 2019, Rhodes, Greece
4th International Verification and Security Workshop (IVSW 2019), Jul 2019, Rhodes, Greece. pp.43-48, ⟨10.1109/IVSW.2019.8854428⟩
IVSW
IVSW 2019-4th IEEE International Verification and Security Workshop
IVSW 2019-4th IEEE International Verification and Security Workshop, Jul 2019, Rhodes, Greece. pp.43-48, ⟨10.1109/IVSW.2019.8854428⟩
4th International Verification and Security Workshop
IVSW: International Verification and Security Workshop
IVSW: International Verification and Security Workshop, Jul 2019, Rhodes, Greece
International audience; The testability of electronic devices is of critical importance and it is often supported by IEEE standards. The available methods, on the other hand, can be an entry point to a malicious attacker, if no proper countermeasure
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::64419c541825886c2db1d579f8c020ec
https://hal-lirmm.ccsd.cnrs.fr/lirmm-02306980
https://hal-lirmm.ccsd.cnrs.fr/lirmm-02306980
Autor:
Vincent Royet, Eric Tronche, Jean-Philippe Bayle, Christophe Brenneis, Vincent Reynaud, François Gobin, Cécile Ferry
Publikováno v:
EPJ N-Nuclear Sciences & Technologies
EPJ N-Nuclear Sciences & Technologies, EDP Sciences, 2016, 2, pp.25. ⟨10.1051/epjn/2016018⟩
EPJ Nuclear Sciences & Technologies, Vol 2, p 25 (2016)
EPJ N-Nuclear Sciences & Technologies, 2016, 2, pp.25. ⟨10.1051/epjn/2016018⟩
EPJ N-Nuclear Sciences & Technologies, EDP Sciences, 2016, 2, pp.25. ⟨10.1051/epjn/2016018⟩
EPJ Nuclear Sciences & Technologies, Vol 2, p 25 (2016)
EPJ N-Nuclear Sciences & Technologies, 2016, 2, pp.25. ⟨10.1051/epjn/2016018⟩
International audience; A new electromechanical press for fuel pellet manufacturing was built last year in partnership between CEA-Marcoule and Champalle$^{Alcen}$. This press was developed to shape pellets in a hot cell via remote handling. It has b
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::823538420853622ed56ec235d923d72a
https://hal-cea.archives-ouvertes.fr/cea-01350711/file/bay.pdf
https://hal-cea.archives-ouvertes.fr/cea-01350711/file/bay.pdf
Publikováno v:
HAL
2020 IEEE European Test Symposium (ETS)
European Test Symposium 2020
European Test Symposium 2020, May 2020, Tallin, Estonia. ⟨10.1109/ETS48528.2020.9131571⟩
ETS
2020 IEEE European Test Symposium (ETS)
European Test Symposium 2020
European Test Symposium 2020, May 2020, Tallin, Estonia. ⟨10.1109/ETS48528.2020.9131571⟩
ETS
International audience; The complexity of modern Systems-on-Chips is steadily increasing, which poses hard challenges for testing. In order to be able to face those challenges, several standards have been proposed through history, such as the latest
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::63abcf58311f333202e33064b8b9ac46
https://hal.archives-ouvertes.fr/hal-02887467
https://hal.archives-ouvertes.fr/hal-02887467