Mitigation and Predictive Assessment of SET Immunity of Digital Logic Circuits for Space Missions

Autor: Ygor Q. Aguiar, Frédéric Wrobel, Jean-Luc Autran, Paul Leroux, Frédéric Saigné, Vincent Pouget, Antoine D. Touboul

Publikováno v: Aerospace, Vol 7, Iss 2, p 12 (2020)

Due to the intrinsic masking effects of combinational circuits in digital designs, Single-Event Transient (SET) effects were considered irrelevant compared to the data rupture caused by Single-Event Upset (SEU) effects. However, the importance of con

Externí odkaz: https://doaj.org/article/e03cc6de11ca46b38f5437bd3ff1379f

Assessing the Reliability of Successive Approximate Computing Algorithms under Fault Injection

Autor: Adria Barros de Oliveira, Alberto Bosio, Gennaro S. Rodrigues, Fernanda Lima Kastensmidt, Vincent Pouget

Publikováno v: Journal of Electronic Testing
Journal of Electronic Testing, Springer Verlag, 2019, ⟨10.1007/s10836-019-05806-y⟩

International audience; This work presents two fault injection and dependability test methodologies exploring the fault tolerance of successive approximation algorithms. This type of approximate computing algorithm can present an inherent fault toler

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2b1acbaf03ae293fe732640add3490a7
https://doi.org/10.1007/s10836-019-05806-y

Radiation Hardness Assurance Through System-Level Testing: Risk Acceptance, Facility Requirements, Test Methodology, and Data Exploitation

Autor: Israel Da Costa Lopes, Carlo Cazzaniga, Rudy Ferraro, Frédéric Saigné, Julien Mekki, Vincent Pouget, Salvatore Danzeca, Arto Javanainen, Alexander Koelpin, Jan Budroweit, Kimmo Niskanen, T. Rajkowski, Rosine Coq Germanicus, Nourdine Kerboub, Antoine Touboul, Pierre Wang, Heikki Kettunen, Daniel Soderstrom, Andrea Coronetti, Ruben Garcia Alia, Florent Manni, Cedric Virmontois, David Dangla

Publikováno v: IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2021, 68 (5), pp.958-969. ⟨10.1109/TNS.2021.3061197⟩
IEEE Transactions on Nuclear Science, 2021, 68 (5), pp.958-969. ⟨10.1109/TNS.2021.3061197⟩
IEEE Transactions on Nuclear Science 68 (5): 9360625, 958-969 (2021-05-01)

International audience; Functional verification schemes at a level different from component-level testing are emerging as a cost-effective tool for those space systems for which the risk associated with a lower level of assurance can be accepted. Des

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::63b915288a247e8985652cd7b4305fa4
https://elib.dlr.de/143164/

Impact of Electrical Stress and Neutron Irradiation on Reliability of Silicon Carbide Power MOSFET

Autor: Kimmo Niskanen, Arto Javanainen, Antoine Touboul, Vincent Pouget, A. Michez, Frédéric Wrobel, Jerome Boch, Frédéric Saigné, R. Coq Germanicus

Publikováno v: IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2020, 67 (7), pp.1365-1373. ⟨10.1109/TNS.2020.2983599⟩
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2020, pp.1-1. ⟨10.1109/TNS.2020.2983599⟩
IEEE Transactions on Nuclear Science, 2020, 67 (7), pp.1365-1373. ⟨10.1109/TNS.2020.2983599⟩
IEEE RADECS 2019
IEEE RADECS 2019, Sep 2019, Montpellier, France
IEEE RADECS 2019, Sep 2019, Montpellier, France. pp.1365-1373, ⟨10.1109/TNS.2020.2983599⟩

International audience; The combined effects of electrical stress and neutron irradiation of the last generation of commercial discrete silicon carbide power MOSFETs are studied. The single-event burnout (SEB) sensitivity during neutron irradiation i

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7cde88b943ca259b51849da2e099d1c4
https://hal-normandie-univ.archives-ouvertes.fr/hal-03511987

Mitigation and Predictive Assessment of SET Immunity of Digital Logic Circuits for Space Missions

Autor: Antoine Touboul, F. Saigne, Vincent Pouget, Frédéric Wrobel, Y. Q. Aguiar, Jean-Luc Autran, Paul Leroux

Publikováno v: Aerospace
Aerospace, MDPI, 2020, 7 (2), pp.12. ⟨10.3390/aerospace7020012⟩
Volume 7
Issue 2
Aerospace, 2020, 7 (2), pp.12. ⟨10.3390/aerospace7020012⟩
Aerospace, Vol 7, Iss 2, p 12 (2020)

International audience; Due to the intrinsic masking effects of combinational circuits in digital designs, Single-Event Transient (SET) effects were considered irrelevant compared to the data rupture caused by Single-Event Upset (SEU) effects. Howeve

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ccb53e0fdd6cfe851ceace88a9559c40
https://lirias.kuleuven.be/handle/123456789/652865