Zobrazeno 1 - 10
of 99
pro vyhledávání: '"Vincent Favre-Nicolin"'
Autor:
Wilson A. Crichton, Jérôme Kieffer, Pierre Wattecamps, Valentin Valls, Gilles Berruyer, Marie Ruat, Vincent Favre-Nicolin
Publikováno v:
Journal of Synchrotron Radiation, Vol 30, Iss 6, Pp 1149-1155 (2023)
The unique diffraction geometry of ESRF beamline ID06-LVP offers continuous static 2D or azimuthally resolving data collections over all accessible solid angles available to the tooling geometry. The system is built around a rotating custom-built Pil
Externí odkaz:
https://doaj.org/article/3fab482981c846819eb9030e93248262
Autor:
Jaianth Vijayakumar, Hao Yuan, Nicolas Mille, Stefan Stanescu, Sufal Swaraj, Vincent Favre-Nicolin, Ebrahim Najafi, Adam P. Hitchcock, Rachid Belkhou
Publikováno v:
Journal of Synchrotron Radiation, Vol 30, Iss 4, Pp 746-757 (2023)
Spectro-ptychography offers improved spatial resolution and additional phase spectral information relative to that provided by scanning transmission X-ray microscopes. However, carrying out ptychography at the lower range of soft X-ray energies (e.g.
Externí odkaz:
https://doaj.org/article/4857855b0a44461e84303290c296ab32
Autor:
Nicolas Mille, Hao Yuan, Jaianth Vijayakumar, Stefan Stanescu, Sufal Swaraj, Kewin Desjardins, Vincent Favre-Nicolin, Rachid Belkhou, Adam P. Hitchcock
Publikováno v:
Communications Materials, Vol 3, Iss 1, Pp 1-8 (2022)
Ptychography is an imaging technique based on algorithmic reconstruction of diffraction patterns that improves the spatial resolution of scanning transmission X-ray microscopy. Here, the possibility of ptychography at the carbon K-edge is demonstrate
Externí odkaz:
https://doaj.org/article/ef037edb230e433b9e1c4b52f84de1a1
Autor:
Ni Li, Maxime Dupraz, Longfei Wu, Steven J. Leake, Andrea Resta, Jérôme Carnis, Stéphane Labat, Ehud Almog, Eugen Rabkin, Vincent Favre-Nicolin, Frédéric-Emmanuel Picca, Felisa Berenguer, Rim van de Poll, Jan P. Hofmann, Alina Vlad, Olivier Thomas, Yves Garreau, Alessandro Coati, Marie-Ingrid Richard
Publikováno v:
Scientific Reports, Vol 10, Iss 1, Pp 1-10 (2020)
Abstract We explore the use of continuous scanning during data acquisition for Bragg coherent diffraction imaging, i.e., where the sample is in continuous motion. The fidelity of continuous scanning Bragg coherent diffraction imaging is demonstrated
Externí odkaz:
https://doaj.org/article/c0860d45aeb747b5afb107f33b59caa6
Publikováno v:
Crystals, Vol 7, Iss 10, p 322 (2017)
FOX (Free Objects for Xtallography) is a computer program for solving crystal structures of all types of compounds using the powder data (but also the single crystal data) measured using X-ray, neutron and electron diffraction. It works in direct spa
Externí odkaz:
https://doaj.org/article/8b9481ee5b6e482aaed9f6196d0136dd
Autor:
Andy Götz, Mads Bertelsen, Fabio Dall'Antonia, Erwan Le Gall, Jean-François Perrin, Andrew McCluskey, Tobias Richter, Massimiliano Novelli, Vincent Favre-Nicolin, Patrick Fuhrmann, Claire Walsh, John R Helliwell, Andreas Petzold, Anca Hienola, Giovanni Lamanna, Franciska de Jong, Niklas Blomberg, Bob Jones, Dale Robertson, Luis Maia, Alessandro Olivo, Teodor Ivanoaica, Thomas Holm Rod
Over 120 participants, including IT staff and managers, RIs’ managers, communications specialists, EOSC project contributors and coordinators andexpert scientists, attended the PaNOSC closing event held in Grenoble and online on 29-30 November 2022
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::79c4836cb8a32ec889aeb06731fe389d
Autor:
Jerome Carnis, Joël Eymery, Maxime Dupraz, Guillaume Beutier, Marie-Ingrid Richard, Vincent Favre-Nicolin, Tobias U. Schülli, Ni Li, Olivier P. Thomas, Thomas W. Cornelius, Stéphane Labat, Steven J. Leake, Marc Verdier
Publikováno v:
ACS Nano
ACS Nano, 2020, 14 (8), pp.10305-10312. ⟨10.1021/acsnano.0c03775⟩
ACS Nano, American Chemical Society, 2020, 14 (8), pp.10305-10312. ⟨10.1021/acsnano.0c03775⟩
ACS nano 14(8), 10305-10312 (2020). doi:10.1021/acsnano.0c03775
ACS Nano, 2020, 14 (8), pp.10305-10312. ⟨10.1021/acsnano.0c03775⟩
ACS Nano, American Chemical Society, 2020, 14 (8), pp.10305-10312. ⟨10.1021/acsnano.0c03775⟩
ACS nano 14(8), 10305-10312 (2020). doi:10.1021/acsnano.0c03775
ACS nano 14(8), 10305-10312 (2020). doi:10.1021/acsnano.0c03775
Gallium nitride (GaN) is of technological importance for a wide variety of optoelectronic applications. Defects in GaN, like inversion domain boundaries (IDBs), significantly affect
Gallium nitride (GaN) is of technological importance for a wide variety of optoelectronic applications. Defects in GaN, like inversion domain boundaries (IDBs), significantly affect
Autor:
David Simonne, Jérôme Carnis, Clément Atlan, Corentin Chatelier, Vincent Favre-Nicolin, Maxime Dupraz, Steven J. Leake, Edoardo Zatterin, Andrea Resta, Alessandro Coati, Marie-Ingrid Richard
Publikováno v:
Journal of Applied Crystallography
Journal of Applied Crystallography, 2022, 55 (4), pp.1045-1054. ⟨10.1107/S1600576722005854⟩
Journal of applied crystallography 55(4), 1045-1054 (2022). doi:10.1107/S1600576722005854
Journal of Applied Crystallography, 2022, 55 (4), pp.1045-1054. ⟨10.1107/S1600576722005854⟩
Journal of applied crystallography 55(4), 1045-1054 (2022). doi:10.1107/S1600576722005854
Journal of applied crystallography 55(4), 1045 - 1054 (2022). doi:10.1107/S1600576722005854
Bragg coherent X-ray diffraction is a nondestructive method for probing material structure in three dimensions at the nanoscale, with unprecedented resol
Bragg coherent X-ray diffraction is a nondestructive method for probing material structure in three dimensions at the nanoscale, with unprecedented resol
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::08f0bd98a62615b161d96d74fa81864a
Autor:
Rudolf Dimper, Andrew Gotz, Vincent Favre-Nicolin, Bruno Lebayle, Christian Nevo, Jean-Francois Perrin, Vincente Armando Sole, Harald Reichert, Jean Susini
This strategy paper details all required components to considerably enhance the data processing chain at the ESRF, and in particular the: IT infrastructure commensurate with the data production, including on-line data analysis (ODA) systems, buffer s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6196574e2c4f26baa37c0d9581cb6020
Autor:
G. A. Chahine, R. Berthelon, Steven J. Leake, Joël Eymery, G. Girard, Francois Andrieu, Vincent Favre-Nicolin, Tobias U. Schülli
Publikováno v:
Journal of Applied Physics
Journal of Applied Physics, 2021, 129 (9), pp.095302. ⟨10.1063/5.0033494⟩
Journal of Applied Physics, American Institute of Physics, 2021, 129 (9), pp.095302. ⟨10.1063/5.0033494⟩
Journal of Applied Physics, 2021, 129 (9), pp.095302. ⟨10.1063/5.0033494⟩
Journal of Applied Physics, American Institute of Physics, 2021, 129 (9), pp.095302. ⟨10.1063/5.0033494⟩
International audience; Strain engineered performance enhancement in SiGe channels for p-MOSFETs is one of the main drivers for the development of microelectronic technologies. Thus, there is a need for precise and accurate strain mapping techniques
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::08c58d77828a2a0a51e051c3808eb16f
https://cea.hal.science/cea-03159504
https://cea.hal.science/cea-03159504