Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Vincent Difilippo"'
Autor:
Jitendra S. Goela, Julian D. Gale, Hangyao Wang, Hua Bai, Vincent DiFilippo, Debashis Chakraborty, Michael A. Pickering, Heather A. G. Stern
Publikováno v:
Industrial & Engineering Chemistry Research. 52:15270-15280
Chemical vapor deposition (CVD) processes are often employed to produce high quality materials. In some applications, a relatively fast deposition rate is required to produce thick pieces of material, e.g., on the order of centimeter, in an economica
Autor:
Vincent Difilippo, Seth Coe-Sullivan, John E. Ritter, Craig Breen, Jonathan S. Steckel, Marshall Cox, Peter T. Kazlas, Caroline J. Roush, Maria J. Anc, Mead Misic, Dorai Ramprasad
Publikováno v:
SID Symposium Digest of Technical Papers. 38:856-859
LED displays utilizing quantum dots (QDs) as emitters offer several key advantages over traditional OLEDs, combining the solution processability of polymers with the high efficiency potential of phosphors, all with the stability benefits of an inorga
Publikováno v:
SPIE Proceedings.
Infrared sensors play a critical role in detection, guidance, and targeting in today's military systems and warfighter equipment, ranging from man-portable to space-borne. Although significant progress is being made in the development of IR imagers,
Publikováno v:
Advances in Bioengineering.
One of the major causes of failure of orthopedic implants used in hip replacement surgery is the generation of excessive wear particles. These wear particles accumulate in the joint and initiate an autoimmune reaction which can weaken the bone-implan
Autor:
Thomas G. Tetreault, Leonard C. Feldman, Vincent Difilippo, J. K. Hirvonen, David B. Fenner, Johnathan Bennett
Publikováno v:
SPIE Proceedings.
The surfaces of single-crystal wafers of sapphire and silicon carbide with microelectronic-grade high polish were exposed to a gas-cluster ion beam (GCIB) and significant reductions in roughness were observed. Atomic-force microscopy revealed that th
Autor:
Leonard C. Feldman, Vincent Difilippo, Anil Saigal, Johnathan Bennett, D. B. Fenner, J. K. Hirvonen
Publikováno v:
Scopus-Elsevier
A novel technology utilizing energetic ionized gas cluster ion beams (GCIB) has been successfully used to reduce the surface roughness of SiC for electronic applications. In GCIB, a high-pressure gas, such as argon, is supersonically expanded through
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