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pro vyhledávání: '"Vinay Chinta"'
Autor:
D. Kudithipudi, Vinay Chinta
Publikováno v:
2007 50th Midwest Symposium on Circuits and Systems.
With rapid scaling of CMOS technology, subthreshold and gate leakage mechanisms have become dominant. With feature size scaling beyond 50 nm, gate leakage has become comparable to subthreshold leakage. In such a scenario, gate leakage currents can no
Publikováno v:
SPIE Proceedings.
In this paper we report on alternate solutions to protect against process variability - while also focusing on minimizing simulation time. We have investigated a variety of techniques, including the use of aerial image parameters to flag sites that m