Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Vijayakumar Thangamariappan"'
Autor:
Vijayakumar Thangamariappan, Nidhi Agrawal, Jason Kim, Constantinos Xanthopoulos, Ken Butler, Ira Leventhal, Joe Xiao
Publikováno v:
2022 IEEE International Test Conference (ITC).
Autor:
Chee-Wah Ho, Min-Jian Yang, Nidhi Agrawal, Joe Xiao, Vijayakumar Thangamariappan, Keith Schaub, Ira Leventhal, Constantinos Xanthopoulos
Publikováno v:
ITC
The paper will demonstrate the application of Deep Learning (DL) for the detection of defective tester sockets. The proposed methodology relies on images like those used for manual or rule-based inspection, commonly collected using Automated Optical