Zobrazeno 1 - 10
of 28
pro vyhledávání: '"Vijay Vallabhuni"'
Autor:
Lakshmanachari, S., Sadulla, Shaik, Satyanarayana, G. S. R., Vijay, Vallabhuni, Chandra Shaker, Pittala, Indira, K., Swathi, S.
Publikováno v:
International Journal of Systems Assurance Engineering & Management; Jul2024, Vol. 15 Issue 7, p3076-3087, 12p
Autor:
Sreevani, Menda, Vijay, Vallabhuni, Chaitanya, Kancharapu, Radhika, Chelle, Manjula, Nandi, Radha Krishna Koushik, D., Sai Venumadhav, B., Sai Jaideep, T., Pittala, Chandra Shaker, Shaik, Sadulla
Publikováno v:
International Journal of Systems Assurance Engineering & Management; Mar2024, Vol. 15 Issue 3, p1285-1293, 9p
Autor:
Lakshmanachari, S., Shaik, Sadulla, Satyanarayana, G. S. R., Vasavi, Inapudi, Vijay, Vallabhuni, Pittala, Chandra Shekar
Publikováno v:
International Journal of Systems Assurance Engineering & Management; Mar2024, Vol. 15 Issue 3, p950-956, 7p
Publikováno v:
International Journal of Systems Assurance Engineering & Management; Dec2023, Vol. 14 Issue 6, p2176-2186, 11p
Akademický článek
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Publikováno v:
International Journal of Systems Assurance Engineering & Management; Jun2023, Vol. 14 Issue 3, p894-902, 9p
Autor:
Jujavarapu Sravana, S. K. Hima Bindhu, K. Sharvani, P. Sai Preethi, Saptarshi Sanyal, Vallabhuni Vijay Vallabhuni Vijay, Rajeev Ratna Vallabhuni
Publikováno v:
2021 4th International Conference on Recent Trends in Computer Science and Technology (ICRTCST).
Publikováno v:
Lecture Notes in Electrical Engineering ISBN: 9789811955495
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ba9ce78f690040bc69a491c9e911c45c
https://doi.org/10.1007/978-981-19-5550-1_31
https://doi.org/10.1007/978-981-19-5550-1_31
Optimized VLSI Design of Squaring Multiplier Using Yavadunam Sutra Through Deficiency Bits Reduction
Autor:
J. Sravana, K. S. Indrani, Sankeerth Mahurkar, M. Pranathi, D. Rakesh Reddy, Vijay Vallabhuni
Publikováno v:
Lecture Notes in Electrical Engineering ISBN: 9789811955495
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d1bdf88fad2e9fa206dec35fedbab772
https://doi.org/10.1007/978-981-19-5550-1_36
https://doi.org/10.1007/978-981-19-5550-1_36
Publikováno v:
SILICON (1876990X); Jan2023, Vol. 15 Issue 2, p713-724, 12p