Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Vijay Kiran Kalyanam"'
Publikováno v:
IEEE Journal of Solid-State Circuits. 56:1166-1175
A proactive clock-gating system (PCGS) in a 7-nm Qualcomm® Hexagon™ digital signal processor (DSP) improves performance or energy efficiency by reducing the magnitude of supply voltage ( $V_{\mathrm {DD}}$ ) droops. The PCGS integrates a digital p
Publikováno v:
IEEE Journal of Solid-State Circuits. 56:814-823
A Qualcomm® Hexagon™ compute digital signal processor (CDSP) enhances reliability by integrating a current and temperature limiting system to avoid circuit failures from operating at excessive current levels for a sustained duration or from therma
Publikováno v:
ISSCC
The Hexagon™ compute DSP (CDSP) integrates a master VLIW scalar processor and a slave vector coprocessor to enable high-performance and energy-efficient computing for multimedia, voice, audio, vision, imaging, and machine-learning (ML) applications
Publikováno v:
ITC
Precisely controlled power delivery is critical for high performance systems-on-chip. This work describes functional test sequences to induce large dynamic and static supply voltage droops impacting the minimum operating voltage (V MIN ) of the proce
Publikováno v:
VLSI Circuits
A proactive clock-gating system (PCGS) in a 7nm Qualcomm¯ Hexagon™ digital signal processor (DSP) predicts supply voltage (V DD ) droops based on microarchitectural events and a power-delivery-network (PDN) model and adapts clock frequency (F CLK
Publikováno v:
CICC
A randomized pulse-modulation (RPM) circuit controls the instruction-issue rate in a Qualcomm® Hexagon™ compute DSP (CDSP) for adapting performance to limit current and temperature below target thresholds. The current and temperature limiting syst
Publikováno v:
ICCD
We describe a methodology to model the low power and voltage behavior of multi-voltage custom memories in processors. These models facilitate early power-aware verification by abstracting the transistor-level representation of the memory to its power
Publikováno v:
ACM Great Lakes Symposium on VLSI
Accurately estimating critical path delays is extremely important for yield optimization and for path selection in delay testing. It is well known that dynamic effects such ascoupling noise can significantly affect critical path delays. In traditiona