Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Vidya Neerkundar"'
Autor:
Justyna Zawada, Vidya Neerkundar, Nilanjan Mukherjee, Marek Patyra, Janusz Rajski, Derek Feltham, Cesar Acero, Friedrich Hapke, Jerzy Tyszer, Elham Moghaddam
Publikováno v:
IEEE Design & Test. 33:7-14
Test points are known to improve the fault coverage in BIST applications. This article discusses a new class of test points used to improve the ATPG pattern count in designs that employ embedded deterministic test.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6f16b1005cb1db85b99528d7e4355760
https://doi.org/10.1109/mdat.2016.2590980
https://doi.org/10.1109/mdat.2016.2590980
Autor:
Cesar Acero, Nilanjan Mukherjee, Elham Moghaddam, Marek Patyra, Justyna Zawada, Jerzy Tyszer, Derek Feltham, Friedrich Hapke, Janusz Rajski, Vidya Neerkundar
Publikováno v:
ITC
The introduction of FinFET technology has accelerated the adoption of patterns that target cell internal defects such as cell-aware tests. Even though cell-aware tests can replace stuck-at and transition patterns from the screening point of view, we
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::debb86133caf2ae6b9db7205df7c518f
https://doi.org/10.1109/test.2015.7342383
https://doi.org/10.1109/test.2015.7342383