Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Victor S. Chan"'
Autor:
Marc A. Bergendahl, Carol Boye, Jay W. Strane, Gauri Karve, Dechao Guo, T. Levin, S. Mattam, Dallas Lea, Kangguo Cheng, S. Choi, A. Gaul, Sean Teehan, Andrew M. Greene, Brad Austin, Victor S. Chan
Publikováno v:
2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC).
Ring oscillators (ROs) are used for yield learning during the research phase of a CMOS technology generation. Based on electrical data and binning methods, we improve detection and classification fault methodologies and form a yield detractor pareto.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2e81b5a0ec8f716f3126929b2bad3fd7
https://doi.org/10.1109/asmc.2019.8791793
https://doi.org/10.1109/asmc.2019.8791793
Autor:
Marc A. Bergendahl, Chun-Wing Yeung, Victor S. Chan, Dechao Guo, Dallas Lea, Gauri Karve, T. M. Levin
Publikováno v:
2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC).
We detail the use of ring oscillators (ROs) for yield learning during the research phase of a CMOS technology generation. Failing circuits are located and classified based on electrical analysis of ROs and FETs (Field Effect Transistor) wired out fro
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f3db2de96be3b3bc44f5c39d34778d1a
https://doi.org/10.1109/asmc.2018.8373160
https://doi.org/10.1109/asmc.2018.8373160