Zobrazeno 1 - 10
of 174
pro vyhledávání: '"Victor Perez-Mendez"'
Autor:
Gyuseong Cho, K.H. Jackson, Victor Perez-Mendez, J. A. Kadyk, J.G. Kim, S.K. Ahn, S. Chang, W.A. Wenzel
Publikováno v:
Ahn, S.K.; Kim, J.G.; Perez-Mendez, V.; Chang, S.; Jackson, K.H.; Kadyk, J.A.; et al.(2001). GEM-type detectors using LIGA and etchable glass technologies. Lawrence Berkeley National Laboratory. Lawrence Berkeley National Laboratory: Lawrence Berkeley National Laboratory. Retrieved from: http://www.escholarship.org/uc/item/01m78300
Gas electron multipliers (GEMS) have been made by a deep X-ray lithography technique (LIGA process) using synchrotron radiation on polymethylmethacrylate (PMMA) and by ultraviolet (UV) processes using a UV etchable glass. The gain, stability, and rat
Autor:
K.S. Joo, I.J. Park, J.G. Kim, W. Wenzel, W.S. Hong, J. A. Kadyk, Ho Kyung Kim, S.H. Han, Victor Perez-Mendez
Publikováno v:
IEEE Transactions on Nuclear Science. 47:1820-1824
The characteristics of a columnar CsI layer with gas multiplication was investigated by using beta rays from a /sup 90/Sr source. This layer is intended for use as the primary electron source in any gas avalanche microdetector to avoid severe perform
Publikováno v:
IEEE Transactions on Nuclear Science. 47:2065-2069
We describe the performance of a square micro-dot (MDOT) detector of 50 /spl mu/m pitch, in terms of the defocussing effect and gas gain. Both the count rate variation measurement and the computer simulation showed that the defocussing effect disappe
Autor:
W.S. Hong, M.D. Martin, H.S. Cho, J. A. Kadyk, W. Wenzel, J.B. Hutchins, K. Pitts, S.H. Han, Victor Perez-Mendez
Publikováno v:
IEEE Transactions on Nuclear Science. 46:306-311
Performance and aging tests have been done to characterize gas electron multipliers (GEMs), including further design improvements such as a thicker GEM and a closed GEM. Since the effective GEM gain is typically smaller than the absolute GEM gain, du
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 422:296-299
A conductive coating of doped amorphous silicon carbide (a-Si:C:H) has been used in the fabrication of microdot (MDOT) detectors, to minimize the defocusing, away from the anodes, of the drifting primary electrons. This defocusing is caused by the ex
Autor:
Victor Perez-Mendez, W.S. Hong, H.S. Cho, N. Palaio, Jasmina Vujic, J. A. Kadyk, F. Retiere, O. Biagi
Publikováno v:
IEEE Transactions on Nuclear Science. 45:252-257
The performance of gas avalanche pixel detectors of square and circular geometry, with and without semiconducting surface coating, was characterized in terms of gas gain and active region. Although the electric field profile of the square geometry ca
Publikováno v:
IEEE Transactions on Nuclear Science. 45:275-279
A new method is proposed to improve the spatial and time resolutions, and the detection efficiency with respect to the angle of the incident particles, for gas avalanche micro detectors. The new technique uses a thin (/spl sim/200 /spl mu/m) columnar
Publikováno v:
IEEE Transactions on Nuclear Science. 45:280-284
In a continuation of our earlier tests, tungsten has been used for anode strips in the fabrication of microgap gas chambers (MGCs) in an attempt to find a metallization suitable for gas avalanche microdetectors (MSGCs or MGCs) that will be both highl
Autor:
K.S. Joo, W.S. Hong, H.S. Cho, N. Palaio, J. A. Kadyk, M. Burks, Victor Perez-Mendez, Jasmina Vujic, F. Retiere, Kam Biu Luk
Publikováno v:
Nuclear Physics B - Proceedings Supplements. 61:258-263
Microgap gas chambers (MGCs) fabricated with selected anode metals, including aluminum, gold, chromium, nickel and titanium/tungsten (10/90) have been used in order to study the effect of these different metals upon gas gain, aging, and spark damage.
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 401:81-88
A new technique involves the use of doped amorphous silicon carbide (a-Si:C:H) as a conductive surface coating in the fabrication of microstrip gas chambers, to eliminate the effect of charge accumulation on the substrate surface. The performance of