In-situ TEM studies of materials under ion beams: JANNuS dual beam TEM

Autor: Kaïtasov, O., Fortuna, F., Oliviero, E., Bachelet, C., Delbecq, L., Bourçois, J., Moeyaert, J., Ledu, D., Viaud, T., Pitrel, S., Gentils, A., Décamps, B.

Publikováno v: IBA 20th international conference on Ion Beam Analysis
IBA 20th international conference on Ion Beam Analysis, 2011, Itapema, Brazil

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::3f5d2f11953ec1a98f8f38da880ce597
https://hal.in2p3.fr/in2p3-00771853