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Autor:
Vasily S. Anashin, Linaris R. Bakirov, Viacheslav S. Korolev, Kirill A. Artemyev, Alexander S. Kuznetsov, Aleksandr E. Koziukov, Konstantin Zh. Faradian, Anatoly A. Kazyakin
Publikováno v:
2014 IEEE Radiation Effects Data Workshop (REDW).
The paper presents SEE test results of electronic components foreseen to be used in the satellite equipment. They were provided to determine electronic components hardness level and also SETs studying and techniques to record them.