Zobrazeno 1 - 10
of 151
pro vyhledávání: '"Verspecht J."'
Publikováno v:
2021 97th ARFTG Microwave Measurement Conference (ARFTG).
We present a demonstrator set-up for amplifier error-vector magnitude (EVM) characterization in the presence of wideband load termination arbitrarily set by the user through active modulated signal injection. In the proposed implementation, both the
Autor:
Schreurs, D.1 dominique.schreurs@esat.kuleuven.ac.be., Verspecht, J.2, Acciari, G.3, Colantonio, P.3, Giannini, F.3, Limiti, E.3, Leuzzi, G.4
Publikováno v:
International Journal of RF & Microwave Computer-Aided Engineering. Sep2002, Vol. 12 Issue 5, p460-468. 9p. 5 Diagrams, 1 Graph.
Akademický článek
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Publikováno v:
WHMO4 Advanced Non-Linear Characterization of RF and Microwave Components Workshop and short courses-European Microwave Week 2009
WHMO4 Advanced Non-Linear Characterization of RF and Microwave Components Workshop and short courses-European Microwave Week 2009, Sep 2009, Rome, Italy
WHMO4 Advanced Non-Linear Characterization of RF and Microwave Components Workshop and short courses-European Microwave Week 2009, Sep 2009, Rome, Italy
International audience
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::f68e53005fe94a373023a9da98c01d1e
https://hal.archives-ouvertes.fr/hal-00661134
https://hal.archives-ouvertes.fr/hal-00661134
Publikováno v:
Power Amplifier Sysmposium
Power Amplifier Sysmposium, Jan 2007, Long Beach, United States
Power Amplifier Sysmposium, Jan 2007, Long Beach, United States
International audience
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::f3d04e40df1ef1317dc17b0e8162c774
https://hal.archives-ouvertes.fr/hal-00194856
https://hal.archives-ouvertes.fr/hal-00194856
Autor:
Barataud, Denis, Mallet, Alain, Campovecchio, Michel, Nebus, Jean-Michel, Villotte, Jean-Pierre, Verspecht, J.
Publikováno v:
IMTC/98, 15th IEEE International Conference on Instrumentation and Measurement Technology
IMTC/98, 15th IEEE International Conference on Instrumentation and Measurement Technology, May 1998, St. Paul, MN, United States. pp 1006-1010, ⟨10.1109/IMTC.1998.676875⟩
IMTC/98, 15th IEEE International Conference on Instrumentation and Measurement Technology, May 1998, St. Paul, MN, United States. pp 1006-1010, ⟨10.1109/IMTC.1998.676875⟩
International audience
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::abf51d5db6913d84fcd923cce6f5837c
https://hal-unilim.archives-ouvertes.fr/hal-01069749
https://hal-unilim.archives-ouvertes.fr/hal-01069749
Publikováno v:
Schreurs, D. ; van der Zanden, K. ; Verspecht, J. ; De Raedt, W. ; Nauwelaers, B. (1998) Real-time measurement of InP HEMT'S during large-signal RF overdrive stress. In: Gallium Arsenide Applications Symposium. GAAS 1998, 5-6 October 1998, Amsterdam, The Netherlands.
We show that the "Nonlinear Network Measurement System" allows to accurately measure the real-time degradation of microwave active devices under large-signal RF overdrive stress. This new kind of measurements gives a better insight in the failure mec
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::cf7a767bb8b9146187ed37aa000e1b6a
Autor:
Barataud, Denis, Blache, Fabrice, Campovecchio, Michel, Nebus, Jean-Michel, Villotte, Jean-Pierre, Verspecht, J.
Publikováno v:
Séminaire "Antennes Actives" du CNES
Séminaire "Antennes Actives" du CNES, Jun 1997, Nice, France. pp. 37-43
Séminaire "Antennes Actives" du CNES, Jun 1997, Nice, France. pp. 37-43
National audience
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::c027cb1c258820d0e81dec1284a6468a
https://hal-unilim.archives-ouvertes.fr/hal-01067623
https://hal-unilim.archives-ouvertes.fr/hal-01067623
Publikováno v:
2011 IEEE/RSJ International Conference on Intelligent Robots & Systems (IROS); 2011, p4477-4482, 6p