Zobrazeno 1 - 10
of 24
pro vyhledávání: '"Vermeij Tijmen"'
Publikováno v:
BIO Web of Conferences, Vol 129, p 07013 (2024)
Externí odkaz:
https://doaj.org/article/6fe29870c2354ce7b56586bda7f87b52
Publikováno v:
BIO Web of Conferences, Vol 129, p 23041 (2024)
Externí odkaz:
https://doaj.org/article/3be56ee350d549f39874b1cbb5cb018f
Crystallographic slip system identification methods are widely employed to characterize the fine scale deformation of metals. While powerful, they usually rely on the occurrence of discrete slip bands with clear slip traces and can struggle when comp
Externí odkaz:
http://arxiv.org/abs/2207.12814
Autor:
Vermeij, Tijmen, Verstijnen, Jorn, Cantador, Tim Ramirez y, Blaysat, Benoit, Neggers, Jan, Hoefnagels, Johan
Publikováno v:
Experimental Mechanics (2022)
The continuous development of new multiphase alloys with improved mechanical properties requires quantitative microstructure-resolved observation of the nanoscale deformation mechanisms at, e.g., multiphase interfaces. This calls for a combinatory ap
Externí odkaz:
http://arxiv.org/abs/2201.08249
Autor:
Knabl, Florian, Gutnik, Dominik, Patil, Prathamesh, Bandl, Christine, Vermeij, Tijmen, Pichler, Christian M., Putz, Barbara, Mitterer, Christian
Publikováno v:
In Vacuum December 2024 230
Autor:
Vermeij, Tijmen, Hoefnagels, Johan
Publikováno v:
Scripta Materialia 208 (2022) 114327
The evolution of deformation from plasticity to localization to damage is investigated in ferritic-pearlitic steel through nanometer-resolution microstructure-correlated SEM-DIC (u-DIC) strain mapping, enabled through highly accurate microstructure-t
Externí odkaz:
http://arxiv.org/abs/2104.11817
Digital Image Correlation (DIC) is of vital importance in the field of experimental mechanics, yet, producing suitable DIC patterns for demanding in-situ mechanical tests remains challenging, especially for ultra-fine patterns, despite the large numb
Externí odkaz:
http://arxiv.org/abs/1904.12047
Publikováno v:
Scripta Materialia 162 (2019) 266-271
We report a first exploration of High-angular-Resolution Electron Backscatter Diffraction, without using simulated Electron Backscatter Diffraction patterns as a reference, for absolute stress and orientation measurements in polycrystalline materials
Externí odkaz:
http://arxiv.org/abs/1807.03908
Publikováno v:
In Scripta Materialia 15 March 2019 162:266-271
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