Imaging TOF-SIMS for the surface analysis of silver halide microcrystals

Autor: Lenaerts, J., Gijbels, R., Van Vaeck, L., Verlinden, G., Geuens, I.

Publikováno v: In Applied Surface Science 2003 203:614-619

Quantitative secondary ion mass spectrometry depth profiling of surface layers of cubic silver halide microcrystals

Autor: Verlinden, G., Gijbels, R. ^*, Geuens, I.

Publikováno v: In Journal of the American Society for Mass Spectrometry 1999 10(10):1016-1027

Photographic materials

Autor: Verlinden, G., Gijbels, Renaat, Geuens, I.

Publikováno v: TOF-SIMS: surface analysis by mass spectrometry / Vickerman, J. [edit.]

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=od______2097::2f5856badfed10abc140182c6ec6c41e
https://hdl.handle.net/10067/372560151162165141

TOF-SIMS analysis of carbocyanine dyes adsorbed on silver substrates

Autor: Lenaerts, J., Verlinden, G., Van Vaeck, Luc, Gijbels, Renaat, Geuens, I.

Publikováno v: Proceedings of the 12th International Conference on Secondary Ion Mass Spectrometry, Brussels, 5-11 September 1999 / Benninghoven, A. [edit.]

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=od______2097::e7370655cb78443c55d169883fbd2be7
https://hdl.handle.net/10067/340800151162165141

Chemical surface characterization of complex AgX microcrystals by imaging TOF-SIMS and dual beam depth profiling

Autor: Verlinden, G., Gijbels, Renaat, Geuens, I., de Keyzer, R.

Publikováno v: Proceedings of the 12th International Conference on Secondary Ion Mass Spectrometry, Brussels, 5-11 September 1999 / Benninghoven, A. [edit.]

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=od______2097::d953225953bf1ec9c3482e743ec9129c
https://hdl.handle.net/10067/340810151162165141