Zobrazeno 1 - 10
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pro vyhledávání: '"Venkatesan PV"'
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Akademický článek
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Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Autor:
Akomah BB; School of Civil Engineering, VIT University, Vellore, 632014, Tamil Nadu, India., Ramani PV; School of Civil Engineering, VIT University, Vellore, 632014, Tamil Nadu, India.
Publikováno v:
Heliyon [Heliyon] 2023 Aug 24; Vol. 9 (9), pp. e19423. Date of Electronic Publication: 2023 Aug 24 (Print Publication: 2023).
Autor:
Ramani PV; School of Civil Engineering, Vellore Institute of Technology, India., Arun Kumar TR; School of Civil Engineering, Vellore Institute of Technology, India.
Publikováno v:
International journal of occupational safety and ergonomics : JOSE [Int J Occup Saf Ergon] 2023 Jun; Vol. 29 (2), pp. 747-755. Date of Electronic Publication: 2022 Jul 05.
Autor:
Unni S; Medicine, St. George's University, St. George's, GRD., Eswaradass SC; Neurology, Appusami Hospital, Salem, IND., Krishnan Nair H; Medicine, Saint Louis University School of Medicine, St. Louis, USA., Anandan S; Medicine, Yale New Haven Hospital, New Haven, USA., Mani I; Endocrinology, UPMC Children's Hospital, Pittsburgh, USA., Eswaradass PV; Neurology, University of Tennessee Medical Center, Memphis, USA.
Publikováno v:
Cureus [Cureus] 2022 Jun 27; Vol. 14 (6), pp. e26369. Date of Electronic Publication: 2022 Jun 27 (Print Publication: 2022).
Autor:
Hoffmann M; NaMLab gGmbH, 01187, Dresden, Germany. hoffmann@berkeley.edu.; Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, CA, 94720, USA. hoffmann@berkeley.edu., Wang Z; School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, 30332, USA., Tasneem N; School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, 30332, USA., Zubair A; Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, 02142, USA., Ravindran PV; School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, 30332, USA., Tian M; Institute for Electronics and Nanotechnology, Georgia Institute of Technology, Atlanta, GA, 30332, USA., Gaskell AA; School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, 30332, USA., Triyoso D; TEL Technology Center, America, LLC, 255 Fuller Rd., Suite 214, Albany, NY, 12203, USA., Consiglio S; TEL Technology Center, America, LLC, 255 Fuller Rd., Suite 214, Albany, NY, 12203, USA., Tapily K; TEL Technology Center, America, LLC, 255 Fuller Rd., Suite 214, Albany, NY, 12203, USA., Clark R; TEL Technology Center, America, LLC, 255 Fuller Rd., Suite 214, Albany, NY, 12203, USA., Hur J; School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, 30332, USA., Pentapati SSK; School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, 30332, USA., Lim SK; School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, 30332, USA., Dopita M; Department of Condensed Matter Physics, Faculty of Mathematics and Physics, Charles University, Ke Karlovu 5, 12116, Prague, Czech Republic., Yu S; School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, 30332, USA., Chern W; Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, 02142, USA.; Izentis LLC, PO Box 397002, Cambridge, MA, 02139, USA., Kacher J; School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, GA, 30332, USA., Reyes-Lillo SE; Departamento de Ciencias Físicas, Universidad Andres Bello, Santiago, 837-0136, Chile., Antoniadis D; Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, 02142, USA., Ravichandran J; Department of Chemical Engineering and Materials Science, University of Southern California, Los Angeles, CA, 90089, USA., Slesazeck S; NaMLab gGmbH, 01187, Dresden, Germany., Mikolajick T; NaMLab gGmbH, 01187, Dresden, Germany.; Institute of Semiconductors and Microsystems, TU Dresden, Dresden, Germany., Khan AI; School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, 30332, USA. asif.khan@ece.gatech.edu.; School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, GA, 30332, USA. asif.khan@ece.gatech.edu.
Publikováno v:
Nature communications [Nat Commun] 2022 Mar 09; Vol. 13 (1), pp. 1228. Date of Electronic Publication: 2022 Mar 09.
Autor:
Balaji PV; Institute of Microbial Chemistry, 3-14-23 Kamiosaki, Shinagawa-ku, Tokyo, 141-0021, Japan., Li Z; Institute of Microbial Chemistry, 3-14-23 Kamiosaki, Shinagawa-ku, Tokyo, 141-0021, Japan., Saito A; Institute of Microbial Chemistry, 3-14-23 Kamiosaki, Shinagawa-ku, Tokyo, 141-0021, Japan., Kumagai N; Institute of Microbial Chemistry, 3-14-23 Kamiosaki, Shinagawa-ku, Tokyo, 141-0021, Japan., Shibasaki M; Institute of Microbial Chemistry, 3-14-23 Kamiosaki, Shinagawa-ku, Tokyo, 141-0021, Japan.
Publikováno v:
Chemistry (Weinheim an der Bergstrasse, Germany) [Chemistry] 2020 Dec 01; Vol. 26 (67), pp. 15524-15527. Date of Electronic Publication: 2020 Nov 12.
Autor:
Vemulakonda SHP; General Surgery, Jawaharlal Institute of Postgraduate Medical Education and Research, Puducherry, IND., Samy AM; General Surgery, Jawaharlal Institute of Postgraduate Medical Education and Research, Puducherry, IND., Venkatesan PV; Surgery, Jawaharlal Institute of Postgraduate Medical Education and Research, Puducherry, IND., Elamurugan TP; Surgery, Jawaharlal Institute of Postgraduate Medical Education and Research, Puducherry, IND., Maroju N; Surgery, Jawaharlal Institute of Postgraduate Medical Education and Research, Puducherry, IND.
Publikováno v:
Cureus [Cureus] 2020 Jun 19; Vol. 12 (6), pp. e8700. Date of Electronic Publication: 2020 Jun 19.