Zobrazeno 1 - 10
of 21
pro vyhledávání: '"Venkanna Kanneboina"'
Publikováno v:
Materials Today: Proceedings.
Publikováno v:
Journal of Materials Science: Materials in Electronics. 32:4457-4465
Crystalline silicon (c-Si)/ hydrogenated amorphous silicon (a-Si:H) heterojunction (Ag/Al/c-Si(n)/a-Si:H(i)/a-Si:H(p)/ITO/Ag) solar cells were fabricated by RF-PECVD technique. The efficiency (η), short circuit current density (Jsc) and fill factor
Autor:
Venkanna Kanneboina
Publikováno v:
Journal of Computational Electronics. 20:344-352
The performance of c-Si/a-Si:H heterojunction solar cells with different emitter layers is studied by using the automat for simulation of heterostructures (AFORS-HET) tool. The a-Si:H(p) layer in the Ag/ZnO/a-Si:H(p)/a-Si:H(i)/c-Si(n)/a-Si:H(i)/a-Si:
Autor:
Venkanna Kanneboina
Publikováno v:
Bulletin of Materials Science. 44
This article presents effective utilization of light by transparent conducting oxide (TCO) layer to enhance the performance of c-Si/a-Si:H heterojunction solar cells (HJSC) by simulation. The optical and recombination losses in solar cells severely d
Publikováno v:
Thin Solid Films. 682:126-130
Hot-wire chemical vapour deposition is a versatile technique to deposit a-Si:H and nc-Si films at higher deposition rate (~5–10 A/s) as compared to Plasma enhanced chemical vapour deposition (1–2 A/s). We report the deposition of highly crystalli
Autor:
Venkanna Kanneboina
Publikováno v:
Microelectronic Engineering. 265:111884
Autor:
Venkanna Kanneboina, Pratima Agarwal
Publikováno v:
SN Applied Sciences. 3
Spectroscopic ellipsometry (SE) is a sophisticated technique to find the optical constants, bandgap and microstructure of thin layer. SE is used to study the microstructure evolution in boron-doped amorphous silicon films for different hydrogen flow
Autor:
Venkanna Kanneboina
This paper presents the influence of defect states and thickness of interface layer on high efficiency of c-Si/a-Si:H heterojunction solar cells with higher bandgap emitter a-Si:H(p) layer by AFORSHET simulation tool. At first, the performance of Ag/
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ed6e6aed6a719d24659503bee3065a7b
https://doi.org/10.21203/rs.3.rs-210502/v1
https://doi.org/10.21203/rs.3.rs-210502/v1
Autor:
Pratima Agarwal, Venkanna Kanneboina
Publikováno v:
Journal of Electronic Materials. 48:2404-2410
The influence of hydrogen flow rate on the microstructure and optical properties of phosphorous doped hydrogenated amorphous silicon (a-Si:H(n)) films is studied through spectroscopic ellipsometry (SE). A series of a-Si:H(n) films were deposited usin
Publikováno v:
Thin Solid Films. 662:155-164
The effect of variation of radio frequency (rf) power on the structural, optical and electronic properties of intrinsic hydrogenated amorphous silicon (a-Si:H) films deposited at very low substrate temperature (Ts) 110 °C were studied. These films w