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pro vyhledávání: '"Venables, John"'
Autor:
Venables, John D.
The crystallographic structure of vanadium carbide having a carbon-to-metal atom ratio close to 0.83 has been determined from electron diffraction and nuclear magnetic resonance (NMR) studies. Material of this composition occurs within the nominally
Externí odkaz:
http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.476030
Autor:
Venables, John
Publikováno v:
The British Medical Journal, 1935 Feb . 1(3867), 331-331.
Externí odkaz:
https://www.jstor.org/stable/25343278
Autor:
Venables, John F.
Publikováno v:
The British Medical Journal, 1930 Mar 01. 1(3608), 415-415.
Externí odkaz:
https://www.jstor.org/stable/25335413
Autor:
Venables, John F.
Publikováno v:
The British Medical Journal, 1928 Oct . 2(3538), 775-775.
Externí odkaz:
https://www.jstor.org/stable/25330396
Autor:
Venables, John D.
Publikováno v:
Journal of Applied Physics; Feb1963, Vol. 34 Issue 2, p293-297, 5p
Publikováno v:
Scanning Microscopy
The growth and surface diffusion of Cs on Si(100) and Ag on Fe(110) have been studied using biassed secondary electron imaging (b-SEI) and Auger electron spectroscopy (AES). The b-SEI technique was found capable of detecting Cs on the Si surface with
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______1459::c798372264b476330035481f8fdf74aa
https://digitalcommons.usu.edu/microscopy/vol8/iss4/6
https://digitalcommons.usu.edu/microscopy/vol8/iss4/6
Autor:
Venables, John A.
Publikováno v:
Introduction to Surface & Thin Film Processes; 2000, p363-372, 10p
Autor:
Venables, John A.
Publikováno v:
Introduction to Surface & Thin Film Processes; 2000, p331-362, 32p
Autor:
Venables, John A.
Publikováno v:
Introduction to Surface & Thin Film Processes; 2000, p314-317, 4p